Whole-chip ESD protection for CMOS VLSI/ULSI with multiple power pins

Ming-Dou Ker; Chung-Yu Wu; Tao Cheng; Michael J.N. Wu; T. L. Yu; Alex C. Wang

doi:10.1109/IRWS.1994.515839

Whole-chip ESD protection for CMOS VLSI/ULSI with multiple power pins

Ming-Dou Ker^*
, Chung-Yu Wu
, Tao Cheng
, Michael J.N. Wu
, T. L. Yu
, Alex C. Wang

^*Corresponding author for this work

Institute of Electronics

Research output: Contribution to conference › Paper › peer-review

9 Scopus citations

Abstract

An anomalous phenomenon of ESD failure in CMOS ICs with multiple VDD and VSS power-supply pins is discovered and investigated. A method of whole-chip ESD protection to overcome this anomalous ESD failure is proposed with experimental verification.

Original language	English
Pages	124-128
Number of pages	5
DOIs	https://doi.org/10.1109/IRWS.1994.515839
State	Published - 1994
Event	Proceedings of the 1994 International Integrated Reliability Workshop Final Report - Lake Tahoe, CA, USA Duration: 16 Oct 1994 → 19 Oct 1994

Conference

Conference	Proceedings of the 1994 International Integrated Reliability Workshop Final Report
City	Lake Tahoe, CA, USA
Period	16/10/94 → 19/10/94

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10.1109/IRWS.1994.515839

Cite this

@conference{d7b5299f604649bd877a4ce35fb20f0e,

title = "Whole-chip ESD protection for CMOS VLSI/ULSI with multiple power pins",

abstract = "An anomalous phenomenon of ESD failure in CMOS ICs with multiple VDD and VSS power-supply pins is discovered and investigated. A method of whole-chip ESD protection to overcome this anomalous ESD failure is proposed with experimental verification.",

author = "Ming-Dou Ker and Chung-Yu Wu and Tao Cheng and Wu, \{Michael J.N.\} and Yu, \{T. L.\} and Wang, \{Alex C.\}",

year = "1994",

doi = "10.1109/IRWS.1994.515839",

language = "English",

pages = "124--128",

note = "Proceedings of the 1994 International Integrated Reliability Workshop Final Report ; Conference date: 16-10-1994 Through 19-10-1994",

}

TY - CONF

T1 - Whole-chip ESD protection for CMOS VLSI/ULSI with multiple power pins

AU - Ker, Ming-Dou

AU - Wu, Chung-Yu

AU - Cheng, Tao

AU - Wu, Michael J.N.

AU - Yu, T. L.

AU - Wang, Alex C.

PY - 1994

Y1 - 1994

N2 - An anomalous phenomenon of ESD failure in CMOS ICs with multiple VDD and VSS power-supply pins is discovered and investigated. A method of whole-chip ESD protection to overcome this anomalous ESD failure is proposed with experimental verification.

AB - An anomalous phenomenon of ESD failure in CMOS ICs with multiple VDD and VSS power-supply pins is discovered and investigated. A method of whole-chip ESD protection to overcome this anomalous ESD failure is proposed with experimental verification.

UR - https://www.scopus.com/pages/publications/0028736733

U2 - 10.1109/IRWS.1994.515839

DO - 10.1109/IRWS.1994.515839

M3 - Paper

AN - SCOPUS:0028736733

SP - 124

EP - 128

T2 - Proceedings of the 1994 International Integrated Reliability Workshop Final Report

Y2 - 16 October 1994 through 19 October 1994

ER -

Whole-chip ESD protection for CMOS VLSI/ULSI with multiple power pins

Abstract

Conference

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