VIB-3 Correlation Between Substrate and Gate Currents in MOSFETs

P. K. Ko; S. M. Tam; Chen-Ming Hu; R. S. Muller

doi:10.1109/T-ED.1981.20591

VIB-3 Correlation Between Substrate and Gate Currents in MOSFETs

P. K. Ko, S. M. Tam, Chen-Ming Hu, R. S. Muller

International College of Semiconductor Technology

Research output: Contribution to journal › Article › peer-review

2 Scopus citations

Original language	English
Pages (from-to)	1260-1261
Number of pages	2
Journal	IEEE Transactions on Electron Devices
Volume	28
Issue number	10
DOIs	https://doi.org/10.1109/T-ED.1981.20591
State	Published - 1 Jan 1981

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title = "VIB-3 Correlation Between Substrate and Gate Currents in MOSFETs",

author = "Ko, {P. K.} and Tam, {S. M.} and Chen-Ming Hu and Muller, {R. S.}",

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AU - Ko, P. K.

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AU - Muller, R. S.

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JO - Ieee Transactions On Electron Devices

JF - Ieee Transactions On Electron Devices

SN - 0018-9383

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VIB-3 Correlation Between Substrate and Gate Currents in MOSFETs

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