Unsupervised Image Enhancement for Nonlinear Optical Microscopy with Scarce Samples

Yun Jie Jhang, Xin Lin, Shih Hsuan Chia, Wei Chung Chen, I. Chen Wu, Ming Tsang Wu, Guan Yu Zhuo, Hung Wen Chen*

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

We present an unsupervised model without any assumptions to enhance images in nonlinear optical microscopy. It only takes 30 training images and can be generalized to unseen samples. Qualitative and quantitative results show significant improvement.

Original languageEnglish
Title of host publication2023 Conference on Lasers and Electro-Optics, CLEO 2023
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781957171258
StatePublished - 2023
Event2023 Conference on Lasers and Electro-Optics, CLEO 2023 - San Jose, United States
Duration: 7 May 202312 May 2023

Publication series

Name2023 Conference on Lasers and Electro-Optics, CLEO 2023

Conference

Conference2023 Conference on Lasers and Electro-Optics, CLEO 2023
Country/TerritoryUnited States
CitySan Jose
Period7/05/2312/05/23

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