Ultralow 1/f Noise in a Heterostructure of Superconducting Epitaxial Cobalt Disilicide Thin Film on Silicon

Keyphrases

• Epitaxial 100%
• Heterostructure 100%
• CoSi2 100%
• Ultra-low 100%
• Cobalt 100%
• Disilicide 100%
• High-resolution 33%
• Superconducting Transition Temperature 33%
• Silica 33%
• Noise Measurement 33%
• Si Substrate 33%
• Integrated Circuits 33%
• Cross-sectional Transmission Electron Microscopy 33%
• Si(111) 33%
• Low Noise 33%
• Noise Properties 33%
• Electron Microscopy Studies 33%
• Detrapping 33%
• Qubit 33%
• Silicon-based 33%
• Noise Level 33%
• Dangling Bonds 33%
• Normal State Properties 33%
• Excess Si 33%
• Localized Charges 33%
• Unbonded 33%
• Single Crystal Aluminum 33%
• Aluminum Film 33%
• Quantum Computing 33%
• Superconducting Circuits 33%
• Resistance Noise 33%

Physics

• Quantum Dot 100%
• Heterojunctions 100%
• Thin Films 100%
• Integrated Circuit 100%
• Low Noise 100%
• High Resolution 100%
• Transmission Electron Microscopy 100%
• Quantum Computing 100%
• Noise Measurement 100%

Material Science

• Thin Films 100%
• Silicon 100%
• Electronic Circuit 100%
• Heterojunction 100%
• Cobalt 100%
• Film 50%
• Transmission Electron Microscopy 50%
• Aluminum 50%