Ultimate top-down etching processes for future nanoscale devices: Advanced neutral-beam etching

Seiji Samukawa*

*Corresponding author for this work

Research output: Contribution to journalReview articlepeer-review

140 Scopus citations

Fingerprint

Dive into the research topics of 'Ultimate top-down etching processes for future nanoscale devices: Advanced neutral-beam etching'. Together they form a unique fingerprint.

Keyphrases

Physics

Material Science