Treatment of semiconductor wastewater using single-stage partial nitrification and anammox in a pilot-scale reactor

Ying Chang Liang, Achlesh Daverey*, Yu Tzu Huang, Shihwu Sung, Jih-Gaw Lin

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

28 Scopus citations

Abstract

Start-up of pilot scale reactor to treat real semiconductor wastewater is reported in this study. Semiconductor industrial wastewater stream was characterized as highly alkaline (pH 10) and contained high concentration of H 2 O 2 of 311 ± 505mg/L, ammonium nitrogen of 318 ± 122 NH 4 + -Nmg/L and negligible COD of <10mg/L. H 2 O 2 was removed by adding enzyme "REYONET F-35" and H 2 SO 4 . Before the H 2 O 2 -free wastewater is fed to the biological reactor, the pH is adjusted to ~7.0. Completely autotrophic nitrogen removal over nitrite (CANON) process was cultivated in a 1.0m 3 pilot-scale sequencing batch reactor by using enzyme pretreated semiconductor wastewater without temperature control. The nitrogen loading rate was increased step-wise from 94 to 665g NH 4 + -N/m 3 d. The average NH 4 + -N and total nitrogen removal efficiencies were 85.5 and 75.7%, respectively at NLR of 665g NH 4 + -N/m 3 d and HRT of 4d. The pilot reactor was successfully started up and operated for more than 550d. The CANON was evidenced by the ratio of the effluent nitrite and nitrate to ammonium ratio (η) of 0.076 during the steady state operation period. PCR results also confirmed the presence of AOB (aerobic ammonia oxidizing bacteria) and anammox (anaerobic ammonia oxidizing) bacteria in the reactor.

Original languageEnglish
Pages (from-to)236-242
Number of pages7
JournalJournal of the Taiwan Institute of Chemical Engineers
Volume63
DOIs
StatePublished - 1 Jun 2016

Keywords

  • Anammox
  • Nitrogen removal
  • Partial nitrification
  • Semiconductor industrial wastewater

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