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Trapping Depth and Transition Probability of Four-Level Random Telegraph Noise in a Gate-All-Around Poly-Si Nanowire Transistor
You Tai Chang*, Yueh Lin Tsai, Kang Ping Peng, Chun Jung Su, Pei-Wen Li, Horng-Chih Lin
*Corresponding author for this work
Research output: Contribution to journal › Article › peer-review