Transmission Line Pulse Width Impacting on Device Performances

Shao Chang Huang*, Chien Wei Wang, Chih Hsuan Lin, Kai Chieh Hsu, Ching Ho Li*, Chih Cherng Liao, Jung Tsun Chuang, Gong Kai Lin, Lin Fan Chen, Chun Chih Chen, Yeh Ning Jou, Jian Hsing Lee, Ke Horng Chen*

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Transmission Line Pulse Generator (TLPG) is often applied for Electrostatic Discharge (ESD) discoveries. Since this machine is designed from the transmission line, unlimited to the common voltage source, it is often applied for Devices' electrical Safe Operation Area (eSOA) measurements with high currents. Different transmission line pulse widths can result in different device data. HBM event is often with 100 ns pulse width, but is 100 ns suitable for eSOA? Through silicon data analyses, the pulse width equal to 200 ns is proposed for Large Array Device (LAD) characteristics measurements in this study.

Original languageEnglish
Title of host publication2023 International Conference on Consumer Electronics - Taiwan, ICCE-Taiwan 2023 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages227-228
Number of pages2
ISBN (Electronic)9798350324174
DOIs
StatePublished - 2023
Event2023 International Conference on Consumer Electronics - Taiwan, ICCE-Taiwan 2023 - Pingtung, Taiwan
Duration: 17 Jul 202319 Jul 2023

Publication series

Name2023 International Conference on Consumer Electronics - Taiwan, ICCE-Taiwan 2023 - Proceedings

Conference

Conference2023 International Conference on Consumer Electronics - Taiwan, ICCE-Taiwan 2023
Country/TerritoryTaiwan
CityPingtung
Period17/07/2319/07/23

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