Transient-to-digital converter to detect electrical fast transient (EFT) disturbance for system protection design

Cheng Cheng Yen; Wan Yen Lin; Ming-Dou Ker; Ching Ling Tsai; Shih Fan Chen; Tung Yang Chen

doi:10.1109/ICICDT.2011.5783183

Transient-to-digital converter to detect electrical fast transient (EFT) disturbance for system protection design

Cheng Cheng Yen^*, Wan Yen Lin, Ming-Dou Ker, Ching Ling Tsai, Shih Fan Chen, Tung Yang Chen

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

1 Scopus citations

Abstract

A new on-chip 4-bit transient-to-digital converter for electrical fast transient (EFT) protection design has been proposed. The converter is designed to detect EFT-induced transient disturbances and transfer different EFT voltages into digital codes under EFT tests. The experimental results in silicon chip have confirmed the successful digital output codes.

Original language	English
Title of host publication	2011 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2011
DOIs	https://doi.org/10.1109/ICICDT.2011.5783183
State	Published - 24 Jun 2011
Event	2011 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2011 - Kaohsiung, Taiwan Duration: 2 May 2011 → 4 May 2011

Publication series

Name	2011 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2011

Conference

Conference	2011 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2011
Country/Territory	Taiwan
City	Kaohsiung
Period	2/05/11 → 4/05/11

Keywords

Electrical fast transient (EFT) test
Electromagnetic compatibility (EMC)
Transient detection circuit
Transient-to-digital converter

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10.1109/ICICDT.2011.5783183

Cite this

Yen, C. C., Lin, W. Y., Ker, M-D., Tsai, C. L., Chen, S. F., & Chen, T. Y. (2011). Transient-to-digital converter to detect electrical fast transient (EFT) disturbance for system protection design. In 2011 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2011 [5783183] (2011 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2011). https://doi.org/10.1109/ICICDT.2011.5783183

@inproceedings{cae17b44c0c74109b5c0140087c990bc,

title = "Transient-to-digital converter to detect electrical fast transient (EFT) disturbance for system protection design",

abstract = "A new on-chip 4-bit transient-to-digital converter for electrical fast transient (EFT) protection design has been proposed. The converter is designed to detect EFT-induced transient disturbances and transfer different EFT voltages into digital codes under EFT tests. The experimental results in silicon chip have confirmed the successful digital output codes.",

keywords = "Electrical fast transient (EFT) test, Electromagnetic compatibility (EMC), Transient detection circuit, Transient-to-digital converter",

author = "Yen, {Cheng Cheng} and Lin, {Wan Yen} and Ming-Dou Ker and Tsai, {Ching Ling} and Chen, {Shih Fan} and Chen, {Tung Yang}",

year = "2011",

month = jun,

day = "24",

doi = "10.1109/ICICDT.2011.5783183",

language = "English",

isbn = "9781424490202",

series = "2011 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2011",

booktitle = "2011 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2011",

note = "2011 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2011 ; Conference date: 02-05-2011 Through 04-05-2011",

}

Yen, CC, Lin, WY, Ker, M-D, Tsai, CL, Chen, SF & Chen, TY 2011, Transient-to-digital converter to detect electrical fast transient (EFT) disturbance for system protection design. in 2011 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2011., 5783183, 2011 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2011, 2011 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2011, Kaohsiung, Taiwan, 2/05/11. https://doi.org/10.1109/ICICDT.2011.5783183

Transient-to-digital converter to detect electrical fast transient (EFT) disturbance for system protection design. / Yen, Cheng Cheng; Lin, Wan Yen; Ker, Ming-Dou et al.
2011 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2011. 2011. 5783183 (2011 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2011).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Transient-to-digital converter to detect electrical fast transient (EFT) disturbance for system protection design

AU - Yen, Cheng Cheng

AU - Lin, Wan Yen

AU - Ker, Ming-Dou

AU - Tsai, Ching Ling

AU - Chen, Shih Fan

AU - Chen, Tung Yang

PY - 2011/6/24

Y1 - 2011/6/24

N2 - A new on-chip 4-bit transient-to-digital converter for electrical fast transient (EFT) protection design has been proposed. The converter is designed to detect EFT-induced transient disturbances and transfer different EFT voltages into digital codes under EFT tests. The experimental results in silicon chip have confirmed the successful digital output codes.

AB - A new on-chip 4-bit transient-to-digital converter for electrical fast transient (EFT) protection design has been proposed. The converter is designed to detect EFT-induced transient disturbances and transfer different EFT voltages into digital codes under EFT tests. The experimental results in silicon chip have confirmed the successful digital output codes.

KW - Electrical fast transient (EFT) test

KW - Electromagnetic compatibility (EMC)

KW - Transient detection circuit

KW - Transient-to-digital converter

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U2 - 10.1109/ICICDT.2011.5783183

DO - 10.1109/ICICDT.2011.5783183

M3 - Conference contribution

AN - SCOPUS:79959351404

SN - 9781424490202

T3 - 2011 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2011

BT - 2011 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2011

T2 - 2011 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2011

Y2 - 2 May 2011 through 4 May 2011

ER -

Yen CC, Lin WY, Ker M-D, Tsai CL, Chen SF, Chen TY. Transient-to-digital converter to detect electrical fast transient (EFT) disturbance for system protection design. In 2011 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2011. 2011. 5783183. (2011 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2011). doi: 10.1109/ICICDT.2011.5783183

Transient-to-digital converter to detect electrical fast transient (EFT) disturbance for system protection design

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