Transient-to-digital converter for ESD protection design in microelectronic systems

Ming-Dou Ker; Cheng Cheng Yen; Chi Sheng Liao; Tung Yang Chen; Chih Chung Tsai

doi:10.1109/ASSCC.2008.4708814

Transient-to-digital converter for ESD protection design in microelectronic systems

Ming-Dou Ker^*, Cheng Cheng Yen, Chi Sheng Liao, Tung Yang Chen, Chih Chung Tsai

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

2 Scopus citations

Abstract

An on-chip transient-to-digital converter for system-level electrostatic discharge (ESD) protection is proposed. The proposed transient-to-digital converter is designed to detect fast electrical transients during the system-level ESD events. The output digital thermometer codes can correspond to different ESD voltages under system-level ESD tests. The experimental results in a 0.18-μm CMOS integrated circuit (IC) with 3.3-V devices have confirmed the detection function and digital output codes.

Original language	English
Title of host publication	Proceedings of 2008 IEEE Asian Solid-State Circuits Conference, A-SSCC 2008
Pages	409-412
Number of pages	4
DOIs	https://doi.org/10.1109/ASSCC.2008.4708814
State	Published - 2008
Event	2008 IEEE Asian Solid-State Circuits Conference, A-SSCC 2008 - Fukuoka, Japan Duration: 3 Nov 2008 → 5 Nov 2008

Publication series

Name	Proceedings of 2008 IEEE Asian Solid-State Circuits Conference, A-SSCC 2008

Conference

Conference	2008 IEEE Asian Solid-State Circuits Conference, A-SSCC 2008
Country/Territory	Japan
City	Fukuoka
Period	3/11/08 → 5/11/08

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10.1109/ASSCC.2008.4708814

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Ker, M.-D., Yen, C. C., Liao, C. S., Chen, T. Y., & Tsai, C. C. (2008). Transient-to-digital converter for ESD protection design in microelectronic systems. In Proceedings of 2008 IEEE Asian Solid-State Circuits Conference, A-SSCC 2008 (pp. 409-412). Article 4708814 (Proceedings of 2008 IEEE Asian Solid-State Circuits Conference, A-SSCC 2008). https://doi.org/10.1109/ASSCC.2008.4708814

@inproceedings{c1d74f3138d74ef4aaefec4b5b03c2d5,

title = "Transient-to-digital converter for ESD protection design in microelectronic systems",

abstract = "An on-chip transient-to-digital converter for system-level electrostatic discharge (ESD) protection is proposed. The proposed transient-to-digital converter is designed to detect fast electrical transients during the system-level ESD events. The output digital thermometer codes can correspond to different ESD voltages under system-level ESD tests. The experimental results in a 0.18-μm CMOS integrated circuit (IC) with 3.3-V devices have confirmed the detection function and digital output codes.",

author = "Ming-Dou Ker and Yen, {Cheng Cheng} and Liao, {Chi Sheng} and Chen, {Tung Yang} and Tsai, {Chih Chung}",

year = "2008",

doi = "10.1109/ASSCC.2008.4708814",

language = "English",

isbn = "9781424426058",

series = "Proceedings of 2008 IEEE Asian Solid-State Circuits Conference, A-SSCC 2008",

pages = "409--412",

booktitle = "Proceedings of 2008 IEEE Asian Solid-State Circuits Conference, A-SSCC 2008",

note = "2008 IEEE Asian Solid-State Circuits Conference, A-SSCC 2008 ; Conference date: 03-11-2008 Through 05-11-2008",

}

Ker, M-D, Yen, CC, Liao, CS, Chen, TY & Tsai, CC 2008, Transient-to-digital converter for ESD protection design in microelectronic systems. in Proceedings of 2008 IEEE Asian Solid-State Circuits Conference, A-SSCC 2008., 4708814, Proceedings of 2008 IEEE Asian Solid-State Circuits Conference, A-SSCC 2008, pp. 409-412, 2008 IEEE Asian Solid-State Circuits Conference, A-SSCC 2008, Fukuoka, Japan, 3/11/08. https://doi.org/10.1109/ASSCC.2008.4708814

Transient-to-digital converter for ESD protection design in microelectronic systems. / Ker, Ming-Dou; Yen, Cheng Cheng; Liao, Chi Sheng et al.
Proceedings of 2008 IEEE Asian Solid-State Circuits Conference, A-SSCC 2008. 2008. p. 409-412 4708814 (Proceedings of 2008 IEEE Asian Solid-State Circuits Conference, A-SSCC 2008).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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T1 - Transient-to-digital converter for ESD protection design in microelectronic systems

AU - Ker, Ming-Dou

AU - Yen, Cheng Cheng

AU - Liao, Chi Sheng

AU - Chen, Tung Yang

AU - Tsai, Chih Chung

PY - 2008

Y1 - 2008

N2 - An on-chip transient-to-digital converter for system-level electrostatic discharge (ESD) protection is proposed. The proposed transient-to-digital converter is designed to detect fast electrical transients during the system-level ESD events. The output digital thermometer codes can correspond to different ESD voltages under system-level ESD tests. The experimental results in a 0.18-μm CMOS integrated circuit (IC) with 3.3-V devices have confirmed the detection function and digital output codes.

AB - An on-chip transient-to-digital converter for system-level electrostatic discharge (ESD) protection is proposed. The proposed transient-to-digital converter is designed to detect fast electrical transients during the system-level ESD events. The output digital thermometer codes can correspond to different ESD voltages under system-level ESD tests. The experimental results in a 0.18-μm CMOS integrated circuit (IC) with 3.3-V devices have confirmed the detection function and digital output codes.

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U2 - 10.1109/ASSCC.2008.4708814

DO - 10.1109/ASSCC.2008.4708814

M3 - Conference contribution

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SN - 9781424426058

T3 - Proceedings of 2008 IEEE Asian Solid-State Circuits Conference, A-SSCC 2008

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EP - 412

BT - Proceedings of 2008 IEEE Asian Solid-State Circuits Conference, A-SSCC 2008

T2 - 2008 IEEE Asian Solid-State Circuits Conference, A-SSCC 2008

Y2 - 3 November 2008 through 5 November 2008

ER -

Transient-to-digital converter for ESD protection design in microelectronic systems

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