Transient detection circuit for system-level ESD protection and its on-board behavior with EMI/EMC filters

Ming-Dou Ker; Chi Sheng Liao; Cheng Cheng Yen

doi:10.1109/ISEMC.2008.4652088

Transient detection circuit for system-level ESD protection and its on-board behavior with EMI/EMC filters

Ming-Dou Ker, Chi Sheng Liao, Cheng Cheng Yen

Research output: Contribution to journal › Conference article › peer-review

4 Scopus citations

Abstract

A new on-chip transient detection circuit for system-level electrostatic discharge (ESD) protection is proposed. The circuit performance of detecting fast electrical transients has been verified in a 0.18-μm CMOS integrated circuit (IC). The experimental results have confirmed that the proposed on-chip transient detection circuit can detect positive and negative fast electrical transients during system-level ESD zapping. Three board-level noise filtering networks have been investigated their enhancement on detection range of the proposed on-chip transient detection circuit. The chip-level solution can be further co-designed with the board-level solution in order to meet high system-level ESD specification.

Original language	English
Article number	4652088
Journal	IEEE International Symposium on Electromagnetic Compatibility
Volume	2008-January
DOIs	https://doi.org/10.1109/ISEMC.2008.4652088
State	Published - 1 Jan 2008
Event	2008 IEEE International Symposium on Electromagnetic Compatibility, EMC 2008 - Detroit, MI, Germany Duration: 18 Aug 2008 → 22 Aug 2008

Keywords

Detection circuit
Electrostatic discharge (ESD)
ESD protection circuit
System-level ESD test

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10.1109/ISEMC.2008.4652088

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title = "Transient detection circuit for system-level ESD protection and its on-board behavior with EMI/EMC filters",

abstract = "A new on-chip transient detection circuit for system-level electrostatic discharge (ESD) protection is proposed. The circuit performance of detecting fast electrical transients has been verified in a 0.18-μm CMOS integrated circuit (IC). The experimental results have confirmed that the proposed on-chip transient detection circuit can detect positive and negative fast electrical transients during system-level ESD zapping. Three board-level noise filtering networks have been investigated their enhancement on detection range of the proposed on-chip transient detection circuit. The chip-level solution can be further co-designed with the board-level solution in order to meet high system-level ESD specification.",

keywords = "Detection circuit, Electrostatic discharge (ESD), ESD protection circuit, System-level ESD test",

author = "Ming-Dou Ker and Liao, {Chi Sheng} and Yen, {Cheng Cheng}",

year = "2008",

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doi = "10.1109/ISEMC.2008.4652088",

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journal = "IEEE International Symposium on Electromagnetic Compatibility",

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T1 - Transient detection circuit for system-level ESD protection and its on-board behavior with EMI/EMC filters

AU - Ker, Ming-Dou

AU - Liao, Chi Sheng

AU - Yen, Cheng Cheng

PY - 2008/1/1

Y1 - 2008/1/1

N2 - A new on-chip transient detection circuit for system-level electrostatic discharge (ESD) protection is proposed. The circuit performance of detecting fast electrical transients has been verified in a 0.18-μm CMOS integrated circuit (IC). The experimental results have confirmed that the proposed on-chip transient detection circuit can detect positive and negative fast electrical transients during system-level ESD zapping. Three board-level noise filtering networks have been investigated their enhancement on detection range of the proposed on-chip transient detection circuit. The chip-level solution can be further co-designed with the board-level solution in order to meet high system-level ESD specification.

AB - A new on-chip transient detection circuit for system-level electrostatic discharge (ESD) protection is proposed. The circuit performance of detecting fast electrical transients has been verified in a 0.18-μm CMOS integrated circuit (IC). The experimental results have confirmed that the proposed on-chip transient detection circuit can detect positive and negative fast electrical transients during system-level ESD zapping. Three board-level noise filtering networks have been investigated their enhancement on detection range of the proposed on-chip transient detection circuit. The chip-level solution can be further co-designed with the board-level solution in order to meet high system-level ESD specification.

KW - Detection circuit

KW - Electrostatic discharge (ESD)

KW - ESD protection circuit

KW - System-level ESD test

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DO - 10.1109/ISEMC.2008.4652088

M3 - Conference article

AN - SCOPUS:84977586191

SN - 0190-1494

VL - 2008-January

JO - IEEE International Symposium on Electromagnetic Compatibility

JF - IEEE International Symposium on Electromagnetic Compatibility

M1 - 4652088

Y2 - 18 August 2008 through 22 August 2008

ER -

Transient detection circuit for system-level ESD protection and its on-board behavior with EMI/EMC filters

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Keywords

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