Time-Correlated Crosstalk Measurements between CMOS Single-Photon Avalanche Diodes

Dai Rong Wu; Chia-Ming Tsai; Sheng-Di Lin

doi:10.1109/OMN.2018.8454598

Time-Correlated Crosstalk Measurements between CMOS Single-Photon Avalanche Diodes

Dai Rong Wu, Chia-Ming Tsai, Sheng-Di Lin

Institute of Electronics

Research output: Contribution to conference › Paper › peer-review

4 Scopus citations

Abstract

We investigate time-resolved crosstalk probability between single-photon avalanche diodes in CMOS technology. The time-correlated crosstalk measurements reveal an unusual double-peak feature. This behavior becomes more significant at higher excess bias voltages and shorter device-To-device distance and its physical reason will be discussed.

Original language	American English
DOIs	https://doi.org/10.1109/OMN.2018.8454598
State	Published - 4 Sep 2018
Event	23rd International Conference on Optical MEMS and Nanophotonics, OMN 2018 - Lausanne, Switzerland Duration: 29 Jul 2018 → 2 Aug 2018

Conference

Conference	23rd International Conference on Optical MEMS and Nanophotonics, OMN 2018
Country/Territory	Switzerland
City	Lausanne
Period	29/07/18 → 2/08/18

Keywords

breakdown flash
CMOS technology
crosstalk
Single-photon avalanche diodes
time correlation

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10.1109/OMN.2018.8454598

Cite this

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title = "Time-Correlated Crosstalk Measurements between CMOS Single-Photon Avalanche Diodes",

abstract = "We investigate time-resolved crosstalk probability between single-photon avalanche diodes in CMOS technology. The time-correlated crosstalk measurements reveal an unusual double-peak feature. This behavior becomes more significant at higher excess bias voltages and shorter device-To-device distance and its physical reason will be discussed.",

keywords = "breakdown flash, CMOS technology, crosstalk, Single-photon avalanche diodes, time correlation",

author = "Wu, {Dai Rong} and Chia-Ming Tsai and Sheng-Di Lin",

year = "2018",

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day = "4",

doi = "10.1109/OMN.2018.8454598",

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T1 - Time-Correlated Crosstalk Measurements between CMOS Single-Photon Avalanche Diodes

AU - Wu, Dai Rong

AU - Tsai, Chia-Ming

AU - Lin, Sheng-Di

PY - 2018/9/4

Y1 - 2018/9/4

N2 - We investigate time-resolved crosstalk probability between single-photon avalanche diodes in CMOS technology. The time-correlated crosstalk measurements reveal an unusual double-peak feature. This behavior becomes more significant at higher excess bias voltages and shorter device-To-device distance and its physical reason will be discussed.

AB - We investigate time-resolved crosstalk probability between single-photon avalanche diodes in CMOS technology. The time-correlated crosstalk measurements reveal an unusual double-peak feature. This behavior becomes more significant at higher excess bias voltages and shorter device-To-device distance and its physical reason will be discussed.

KW - breakdown flash

KW - CMOS technology

KW - crosstalk

KW - Single-photon avalanche diodes

KW - time correlation

UR - http://www.scopus.com/inward/record.url?scp=85053877452&partnerID=8YFLogxK

U2 - 10.1109/OMN.2018.8454598

DO - 10.1109/OMN.2018.8454598

M3 - Paper

AN - SCOPUS:85053877452

T2 - 23rd International Conference on Optical MEMS and Nanophotonics, OMN 2018

Y2 - 29 July 2018 through 2 August 2018

ER -

Time-Correlated Crosstalk Measurements between CMOS Single-Photon Avalanche Diodes

Abstract

Conference

Keywords

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