Thermal stability of SiGe dynamic threshold pMOSFET

W. M. Liao*, C. F. Shih, Pei-Wen Li

*Corresponding author for this work

    Research output: Contribution to conferencePaperpeer-review

    1 Scopus citations
    Original languageEnglish
    Pages137-140
    Number of pages4
    StatePublished - 5 Dec 2005
    Event12th International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2005 - Singapore, Singapore
    Duration: 27 Jun 20051 Jul 2005

    Conference

    Conference12th International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2005
    Country/TerritorySingapore
    CitySingapore
    Period27/06/051/07/05

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