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The Nature of Defects Responsible for Transport in a Hafnia-Based Resistive Random Access Memory Element
D. R. Islamov*, T. V. Perevalov, V. A. Gritsenko, V. Sh Aliev, A. A. Saraev, V. V. Kaichev, E. V. Ivanova, M. V. Zamoryanskaya, A. Chin
*Corresponding author for this work
Research output: Chapter in Book/Report/Conference proceeding › Chapter › peer-review
2
Scopus
citations