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The Influence of Annealing Temperature on Amorphous Indium-Zinc-Tungsten Oxide Thin-Film Transistors
Ruofan Fu, Jianwen Yang, Wei Chiao Chang, Wei Cheng Chang, Chien Min Chang, Dong Lin, Qun Zhang*, Po-Tsun Liu, Han Ping D. Shieh
*Corresponding author for this work
Research output: Contribution to journal › Article › peer-review
13
Scopus
citations