The Impact of Holding Voltage of Transient Voltage Suppressor (TVS) on Signal Integrity of Microelectronics System With CMOS ICs Under System-Level ESD and EFT/Burst Tests

Yu Shu Shen, Ming Dou Ker

Research output: Contribution to journalArticlepeer-review

11 Scopus citations

Fingerprint

Dive into the research topics of 'The Impact of Holding Voltage of Transient Voltage Suppressor (TVS) on Signal Integrity of Microelectronics System With CMOS ICs Under System-Level ESD and EFT/Burst Tests'. Together they form a unique fingerprint.

Keyphrases

Engineering