Abstract
The increase of array size and decrease of cell size make the testing of infrared focal plane array (FPA) being difficult. A design for test scheme, cross-check test, for infrared focal plane array (FPA) is presented in this paper. For an array size of M by N, the testing times can be reduced from the order of M*N to M+N. Analysis on the fault detectability of the proposed test scheme is also presented in this paper.
Original language | English |
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Pages (from-to) | V553-V556 |
Journal | Proceedings - IEEE International Symposium on Circuits and Systems |
Volume | 5 |
DOIs | |
State | Published - 2003 |
Event | Proceedings of the 2003 IEEE International Symposium on Circuits and Systems - Bangkok, Thailand Duration: 25 May 2003 → 28 May 2003 |
Keywords
- Cross-Check Test
- FPA
- Fault Model
- Readout