The fault detection of cross-check test scheme for infrared FPA

Meng Lieh Sheu, Tai Ping Sun, Chi Wen Lu, Mon Chau Shie

Research output: Contribution to journalConference articlepeer-review

Abstract

The increase of array size and decrease of cell size make the testing of infrared focal plane array (FPA) being difficult. A design for test scheme, cross-check test, for infrared focal plane array (FPA) is presented in this paper. For an array size of M by N, the testing times can be reduced from the order of M*N to M+N. Analysis on the fault detectability of the proposed test scheme is also presented in this paper.

Original languageEnglish
Pages (from-to)V553-V556
JournalProceedings - IEEE International Symposium on Circuits and Systems
Volume5
DOIs
StatePublished - 2003
EventProceedings of the 2003 IEEE International Symposium on Circuits and Systems - Bangkok, Thailand
Duration: 25 May 200328 May 2003

Keywords

  • Cross-Check Test
  • FPA
  • Fault Model
  • Readout

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