Fingerprint
Dive into the research topics of 'The Failure Mechanism of the Guard-Rings in Two Different Power Domains during the Latch-Up Test'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
The Failure Mechanism of the Guard-Rings in Two Different Power Domains during the Latch-Up Test
Jian Hsing Lee*, Chih Hsuan Lin, Karuna Nidhi, Chao Yang Chen, Yeh Ning Jou, Ming Dou Ker
*Corresponding author for this work
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
2
Scopus
citations