The Failure Mechanism of the Guard-Rings in Two Different Power Domains during the Latch-Up Test

Jian Hsing Lee*, Chih Hsuan Lin, Karuna Nidhi, Chao Yang Chen, Yeh Ning Jou, Ming Dou Ker

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

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Engineering & Materials Science