The blossoming of memory technology, design, and testing

Shyh-Jye Jou*

*Corresponding author for this work

    Research output: Contribution to journalEditorial

    Original languageEnglish
    Article number4547600
    JournalRecords of the IEEE International Workshop on Memory Technology, Design and Testing
    DOIs
    StatePublished - 1 Dec 2007
    Event17th IEEE International Workshop on Memory Technology, Design, and Testing, MTDT 2007 - Taipei, Taiwan
    Duration: 3 Dec 20075 Dec 2007

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