Testing ThumbPod: Softcore bugs are hard to find

P. Schaumont; K. Sakiyama; Y. Fan; D. Hwang; S. Yang; A. Hodjat; Bo-Cheng Lai; I. Verbauwhede

doi:10.1109/HLDVT.2003.1252478

Testing ThumbPod: Softcore bugs are hard to find

P. Schaumont, K. Sakiyama, Y. Fan, D. Hwang, S. Yang, A. Hodjat, Bo-Cheng Lai, I. Verbauwhede

Institute of Electronics

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

6 Scopus citations

Abstract

We present the debug and test strategies used in the ThumbPod system for Embedded Fingerprint Authentication. ThumbPod uses multiple levels of programming (Java, C and hardware) with a hierarchy of programmable architectures (KVM on top of a SPARC core on top of an FPGA). The ThumbPod project teamed up seven graduate students in the concurrent development and verification of all these programming layers. We pay special attention to the strengths and weaknesses of our bottom-up testing approach.

Original language	English
Title of host publication	Proceedings - 8th IEEE International High-Level Design Validation and Test Workshop, HLDVT 2003
Publisher	IEEE Computer Society
Pages	77-82
Number of pages	6
ISBN (Electronic)	0780382366
DOIs	https://doi.org/10.1109/HLDVT.2003.1252478
State	Published - 1 Jan 2003
Event	8th IEEE International High-Level Design Validation and Test Workshop, HLDVT 2003 - San Francisco, United States Duration: 12 Nov 2003 → 14 Nov 2003

Publication series

Name	Proceedings - IEEE International High-Level Design Validation and Test Workshop, HLDVT
Volume	2003-January
ISSN (Print)	1552-6674

Conference

Conference	8th IEEE International High-Level Design Validation and Test Workshop, HLDVT 2003
Country/Territory	United States
City	San Francisco
Period	12/11/03 → 14/11/03

Keywords

Biosensors
Computer bugs
Cryptography
Data security
Field programmable gate arrays
Fingerprint recognition
Java
Power system security
Protocols
Testing

Access to Document

10.1109/HLDVT.2003.1252478

Cite this

Schaumont, P., Sakiyama, K., Fan, Y., Hwang, D., Yang, S., Hodjat, A., Lai, B-C., & Verbauwhede, I. (2003). Testing ThumbPod: Softcore bugs are hard to find. In Proceedings - 8th IEEE International High-Level Design Validation and Test Workshop, HLDVT 2003 (pp. 77-82). [1252478] (Proceedings - IEEE International High-Level Design Validation and Test Workshop, HLDVT; Vol. 2003-January). IEEE Computer Society. https://doi.org/10.1109/HLDVT.2003.1252478

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title = "Testing ThumbPod: Softcore bugs are hard to find",

abstract = "We present the debug and test strategies used in the ThumbPod system for Embedded Fingerprint Authentication. ThumbPod uses multiple levels of programming (Java, C and hardware) with a hierarchy of programmable architectures (KVM on top of a SPARC core on top of an FPGA). The ThumbPod project teamed up seven graduate students in the concurrent development and verification of all these programming layers. We pay special attention to the strengths and weaknesses of our bottom-up testing approach.",

keywords = "Biosensors, Computer bugs, Cryptography, Data security, Field programmable gate arrays, Fingerprint recognition, Java, Power system security, Protocols, Testing",

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Schaumont, P, Sakiyama, K, Fan, Y, Hwang, D, Yang, S, Hodjat, A, Lai, B-C & Verbauwhede, I 2003, Testing ThumbPod: Softcore bugs are hard to find. in Proceedings - 8th IEEE International High-Level Design Validation and Test Workshop, HLDVT 2003., 1252478, Proceedings - IEEE International High-Level Design Validation and Test Workshop, HLDVT, vol. 2003-January, IEEE Computer Society, pp. 77-82, 8th IEEE International High-Level Design Validation and Test Workshop, HLDVT 2003, San Francisco, United States, 12/11/03. https://doi.org/10.1109/HLDVT.2003.1252478

Testing ThumbPod : Softcore bugs are hard to find. / Schaumont, P.; Sakiyama, K.; Fan, Y. et al.

Proceedings - 8th IEEE International High-Level Design Validation and Test Workshop, HLDVT 2003. IEEE Computer Society, 2003. p. 77-82 1252478 (Proceedings - IEEE International High-Level Design Validation and Test Workshop, HLDVT; Vol. 2003-January).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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Schaumont P, Sakiyama K, Fan Y, Hwang D, Yang S, Hodjat A et al. Testing ThumbPod: Softcore bugs are hard to find. In Proceedings - 8th IEEE International High-Level Design Validation and Test Workshop, HLDVT 2003. IEEE Computer Society. 2003. p. 77-82. 1252478. (Proceedings - IEEE International High-Level Design Validation and Test Workshop, HLDVT). doi: 10.1109/HLDVT.2003.1252478

Testing ThumbPod: Softcore bugs are hard to find

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