Testing strategies for a 9T sub-threshold SRAM

Keyphrases

• SRAM Design 100%
• SRAM Cell Design 100%
• Fault Model 100%
• Subthreshold SRAM 100%
• Testing Strategy 100%
• Cell Design 50%
• Design Techniques 50%
• Cellular Structure 50%
• 6T-SRAM 50%
• Wordline 50%
• Faulty Behavior 50%
• Bitline 50%
• Specialized Tests 50%
• Read Path 50%
• Low-power Devices 50%
• Conventional Test 50%
• Increased Demand 50%
• Subthreshold Region 50%
• Single Bitline 50%
• Real Tests 50%
• March Algorithm 50%
• Stability Fault 50%
• 9T SRAM 50%

Engineering

• Test Method 100%
• Cell Design 66%
• Bit Line 66%
• Fault Model 66%
• Design Technique 33%
• Power Device 33%
• Single Bit 33%
• Increasing Demand 33%

Computer Science

• Design Technique 100%
• Research Effort 100%