Testing process precision for truncated normal distributions

W.l. Pearn*, Hui-Nien Hung, Nan Fu Peng, C. Y. Huang

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

9 Scopus citations

Abstract

Process precision index Cp has been widely used in the manufacturing industry to provide numerical measures of process precision, which essentially reflects product quality consistency. Precision measures using Cp for normal processes, contaminated normal processes, have been investigated extensively, but are neglected for truncated normal processes. Truncated normal processes are common in the manufacturing industry, particularly, for factories equipped with automatic machines handling fully inspections, and scrap/rework products falling outside the specification limits. If the processes follow the normal distribution, then the inspected products (processes) must follow the truncated normal distribution. In this note, we consider the precision measure for truncated normal processes. We investigate the analytically intractable sampling distribution of the estimated Cp, and obtain a rather accurate approximation. Using the results, we develop a practical testing procedure for practitioners to use in their in-plant applications.

Original languageEnglish
Pages (from-to)2275-2281
Number of pages7
JournalMicroelectronics Reliability
Volume47
Issue number12
DOIs
StatePublished - 1 Dec 2007

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