Testing methods for quaternary content addressable memory using charge-sharing sensing scheme

Keyphrases

• Testing Method 100%
• Sensing Scheme 100%
• Charge Sharing 100%
• Content-addressable Memory 100%
• Fault Model 28%
• Testing Algorithm 28%
• New Fault 28%
• Design Techniques 14%
• Power Consumption 14%
• Memory Design 14%
• High-Speed Data 14%
• Ternary Content Addressable Memory 14%
• Process Corners 14%
• Memory BIST 14%
• Memory Test 14%
• Data Search 14%
• Parallel Search 14%

Engineering

• Testing Method 100%
• Fault Model 100%
• Simulation Result 50%
• Design Technique 50%
• Built-in Self Test 50%
• Electric Power Utilization 50%
• Speed Data 50%

Computer Science

• Content-Addressable Memory 100%
• Test Algorithm 28%
• Design Technique 14%
• Power Consumption 14%
• Memory Design 14%
• ternary content addressable memory 14%
• Parallel Search 14%