@inproceedings{b44baf6a80f347708ad5f0731dce7892,
title = "Testing methods for detecting stuck-open power switches in coarse-grain MTCMOS designs",
abstract = "Coarse-grain multi-threshold CMOS (MTCMOS) is an effective power-gating technique to reduce ICs leakage power consumption by turning off idle devices with MTCMOS power switches. In this paper, we study the usage of coarse-grain MTCMOS power switches for both logic circuits and SRAMs, and then propose corresponding methods of testing stuck-open power switches for each of them. For logic circuits, a specialized ATPG framework is proposed to generate a longest possible robust test while creating as many effective transitions in the switch-centered region as possible. For SRAMs, a novel test algorithm is proposed to exercise the worstcase power consumption and performance when stuck-open power switches exist. The experimental results based on an industrial MTCMOS technology demonstrate the advantage of our proposed testing methods on detecting stuck-open power switches for both logic circuits and SRAMs, when compared to conventional testing methods.",
author = "Mu, {Szu Pang} and Wang, {Yi Ming} and Yang, {Hao Yu} and Chia-Tso Chao and Chen, {Shi Hao} and Tseng, {Chih Mou} and Tsai, {Tsung Ying}",
year = "2010",
doi = "10.1109/ICCAD.2010.5654118",
language = "English",
isbn = "9781424481927",
series = "IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "155--161",
booktitle = "2010 IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2010",
address = "美國",
note = "2010 IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2010 ; Conference date: 07-11-2010 Through 11-11-2010",
}