TY - GEN
T1 - Testing Convolutional Neural Network using Adversarial Attacks on Potential Critical Pixels
AU - Lin, Bo Ching
AU - Hsu, Hwai Jung
AU - Huang, Shih Kun
N1 - Publisher Copyright:
© 2020 IEEE.
Copyright:
Copyright 2020 Elsevier B.V., All rights reserved.
PY - 2020/7
Y1 - 2020/7
N2 - Convolutional neural networks (CNNs) are known to be vulnerable to adversarial attacks. Well-crafted perturbations to the inputs can mislead a state-of-the-art CNN to make wrong decisions. Therefore, there is a pressing need for the development of methods that can test or detect the vulnerability of CNNs. In this study, we propose an adversarial attack method, called Dual Iterative Fusion (DIF) with potential critical pixels, for CNN testing to reveal the vulnerability of CNNs. DIF modifies as few as 5 pixels out of 32x32 images in this study and achieves faster, less noticeable, and more targeted attacks to a CNN. Testing CNNs with DIF, we observed that some classes are more vulnerable than the others within many classical CNNs for image classification. In other words, some classes are susceptible to misclassification due to adversarial attacks. For example, in VGG19 trained with CIFAR10 data set, the vulnerable class is 'Cat'. The successfully-targeted attack rate of class 'Cat' in VGG19 is obviously higher than the others, 57.01% versus 25%. In the ResNet18, the vulnerable class is 'Plane', with a successfully-targeted attack rate of 37.08% while the other classes are lower than 12%. These classes should be considered as vulnerabilities in the CNNs, and are pinpointed by generating test images using DIF. The issues can be mitigated through retraining the CNNs with the adversarial images generated by DIF, and the misclassification rate of the vulnerable classes declines at most from 61.67% to 6.37% after the retraining.
AB - Convolutional neural networks (CNNs) are known to be vulnerable to adversarial attacks. Well-crafted perturbations to the inputs can mislead a state-of-the-art CNN to make wrong decisions. Therefore, there is a pressing need for the development of methods that can test or detect the vulnerability of CNNs. In this study, we propose an adversarial attack method, called Dual Iterative Fusion (DIF) with potential critical pixels, for CNN testing to reveal the vulnerability of CNNs. DIF modifies as few as 5 pixels out of 32x32 images in this study and achieves faster, less noticeable, and more targeted attacks to a CNN. Testing CNNs with DIF, we observed that some classes are more vulnerable than the others within many classical CNNs for image classification. In other words, some classes are susceptible to misclassification due to adversarial attacks. For example, in VGG19 trained with CIFAR10 data set, the vulnerable class is 'Cat'. The successfully-targeted attack rate of class 'Cat' in VGG19 is obviously higher than the others, 57.01% versus 25%. In the ResNet18, the vulnerable class is 'Plane', with a successfully-targeted attack rate of 37.08% while the other classes are lower than 12%. These classes should be considered as vulnerabilities in the CNNs, and are pinpointed by generating test images using DIF. The issues can be mitigated through retraining the CNNs with the adversarial images generated by DIF, and the misclassification rate of the vulnerable classes declines at most from 61.67% to 6.37% after the retraining.
KW - Adversarial Attack
KW - Convolutional Neural Network
KW - Testing
UR - http://www.scopus.com/inward/record.url?scp=85094161989&partnerID=8YFLogxK
U2 - 10.1109/COMPSAC48688.2020.000-3
DO - 10.1109/COMPSAC48688.2020.000-3
M3 - Conference contribution
AN - SCOPUS:85094161989
T3 - Proceedings - 2020 IEEE 44th Annual Computers, Software, and Applications Conference, COMPSAC 2020
SP - 1743
EP - 1748
BT - Proceedings - 2020 IEEE 44th Annual Computers, Software, and Applications Conference, COMPSAC 2020
A2 - Chan, W. K.
A2 - Claycomb, Bill
A2 - Takakura, Hiroki
A2 - Yang, Ji-Jiang
A2 - Teranishi, Yuuichi
A2 - Towey, Dave
A2 - Segura, Sergio
A2 - Shahriar, Hossain
A2 - Reisman, Sorel
A2 - Ahamed, Sheikh Iqbal
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 44th IEEE Annual Computers, Software, and Applications Conference, COMPSAC 2020
Y2 - 13 July 2020 through 17 July 2020
ER -