Test coverage optimization for large code problems

Ying-Dar Lin; Chi Heng Chou; Yuan Cheng Lai; Tse Yau Huang; Simon Chung; Jui Tsun Hung; Frank C. Lin

doi:10.1109/WAINA.2012.137

Test coverage optimization for large code problems

Ying-Dar Lin^*, Chi Heng Chou, Yuan Cheng Lai, Tse Yau Huang, Simon Chung, Jui Tsun Hung, Frank C. Lin

^*Corresponding author for this work

Department of Computer Science

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

1 Scopus citations

Abstract

Because running all previous tests for the regression testing of a system is time-consuming, the size of a test suite of the system must be reduced intelligently with adequate test coverage and without compromising its fault detection capability. Five algorithms were designed for reducing the size of test suites where two metrics, test's function reach ability and function's test intensity, were defined. Approaches to the algorithm CW-NumMin, CW-CostMin, or CW-CostCov-B are the safe-mode of test case selection with full-modified function coverage, while the CW-CovMax algorithm is of non-safe mode, which was performed under time restriction. In this study, the most efficient algorithm could reduce the cost (time) of a test suite down to 1.10, on the average, over the MPLS area of Cisco IOS.

Original language	English
Title of host publication	Proceedings - 26th IEEE International Conference on Advanced Information Networking and Applications Workshops, WAINA 2012
Pages	215-220
Number of pages	6
DOIs	https://doi.org/10.1109/WAINA.2012.137
State	Published - 14 May 2012
Event	26th IEEE International Conference on Advanced Information Networking and Applications Workshops, WAINA 2012 - Fukuoka, Japan Duration: 26 Mar 2012 → 29 Mar 2012

Publication series

Name	Proceedings - 26th IEEE International Conference on Advanced Information Networking and Applications Workshops, WAINA 2012

Conference

Conference	26th IEEE International Conference on Advanced Information Networking and Applications Workshops, WAINA 2012
Country/Territory	Japan
City	Fukuoka
Period	26/03/12 → 29/03/12

Keywords

function reachability
regression testing
test case selection
test coverage
test intensity

Access to Document

10.1109/WAINA.2012.137

Cite this

Lin, Y.-D., Chou, C. H., Lai, Y. C., Huang, T. Y., Chung, S., Hung, J. T., & Lin, F. C. (2012). Test coverage optimization for large code problems. In Proceedings - 26th IEEE International Conference on Advanced Information Networking and Applications Workshops, WAINA 2012 (pp. 215-220). Article 6185125 (Proceedings - 26th IEEE International Conference on Advanced Information Networking and Applications Workshops, WAINA 2012). https://doi.org/10.1109/WAINA.2012.137

Lin, Ying-Dar ; Chou, Chi Heng ; Lai, Yuan Cheng et al. / Test coverage optimization for large code problems. Proceedings - 26th IEEE International Conference on Advanced Information Networking and Applications Workshops, WAINA 2012. 2012. pp. 215-220 (Proceedings - 26th IEEE International Conference on Advanced Information Networking and Applications Workshops, WAINA 2012).

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title = "Test coverage optimization for large code problems",

abstract = "Because running all previous tests for the regression testing of a system is time-consuming, the size of a test suite of the system must be reduced intelligently with adequate test coverage and without compromising its fault detection capability. Five algorithms were designed for reducing the size of test suites where two metrics, test's function reach ability and function's test intensity, were defined. Approaches to the algorithm CW-NumMin, CW-CostMin, or CW-CostCov-B are the safe-mode of test case selection with full-modified function coverage, while the CW-CovMax algorithm is of non-safe mode, which was performed under time restriction. In this study, the most efficient algorithm could reduce the cost (time) of a test suite down to 1.10, on the average, over the MPLS area of Cisco IOS.",

keywords = "function reachability, regression testing, test case selection, test coverage, test intensity",

author = "Ying-Dar Lin and Chou, {Chi Heng} and Lai, {Yuan Cheng} and Huang, {Tse Yau} and Simon Chung and Hung, {Jui Tsun} and Lin, {Frank C.}",

year = "2012",

month = may,

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doi = "10.1109/WAINA.2012.137",

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series = "Proceedings - 26th IEEE International Conference on Advanced Information Networking and Applications Workshops, WAINA 2012",

pages = "215--220",

booktitle = "Proceedings - 26th IEEE International Conference on Advanced Information Networking and Applications Workshops, WAINA 2012",

note = "26th IEEE International Conference on Advanced Information Networking and Applications Workshops, WAINA 2012 ; Conference date: 26-03-2012 Through 29-03-2012",

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Lin, Y-D, Chou, CH, Lai, YC, Huang, TY, Chung, S, Hung, JT & Lin, FC 2012, Test coverage optimization for large code problems. in Proceedings - 26th IEEE International Conference on Advanced Information Networking and Applications Workshops, WAINA 2012., 6185125, Proceedings - 26th IEEE International Conference on Advanced Information Networking and Applications Workshops, WAINA 2012, pp. 215-220, 26th IEEE International Conference on Advanced Information Networking and Applications Workshops, WAINA 2012, Fukuoka, Japan, 26/03/12. https://doi.org/10.1109/WAINA.2012.137

Test coverage optimization for large code problems. / Lin, Ying-Dar; Chou, Chi Heng; Lai, Yuan Cheng et al.
Proceedings - 26th IEEE International Conference on Advanced Information Networking and Applications Workshops, WAINA 2012. 2012. p. 215-220 6185125 (Proceedings - 26th IEEE International Conference on Advanced Information Networking and Applications Workshops, WAINA 2012).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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AU - Lin, Frank C.

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AB - Because running all previous tests for the regression testing of a system is time-consuming, the size of a test suite of the system must be reduced intelligently with adequate test coverage and without compromising its fault detection capability. Five algorithms were designed for reducing the size of test suites where two metrics, test's function reach ability and function's test intensity, were defined. Approaches to the algorithm CW-NumMin, CW-CostMin, or CW-CostCov-B are the safe-mode of test case selection with full-modified function coverage, while the CW-CovMax algorithm is of non-safe mode, which was performed under time restriction. In this study, the most efficient algorithm could reduce the cost (time) of a test suite down to 1.10, on the average, over the MPLS area of Cisco IOS.

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Lin YD, Chou CH, Lai YC, Huang TY, Chung S, Hung JT et al. Test coverage optimization for large code problems. In Proceedings - 26th IEEE International Conference on Advanced Information Networking and Applications Workshops, WAINA 2012. 2012. p. 215-220. 6185125. (Proceedings - 26th IEEE International Conference on Advanced Information Networking and Applications Workshops, WAINA 2012). doi: 10.1109/WAINA.2012.137

Test coverage optimization for large code problems

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