Abstract
Temporal universal conductance fluctuations (TUCF's) are observed in RuO2 nanowires at cryogenic temperatures. The fluctuations persist up to very high T∼10 K. Their root-mean-square magnitudes increase with decreasing T, reaching ∼0.2e2/h at T2 K. These fluctuations are shown to originate from scattering of conduction electrons with rich amounts of mobile defects in artificially synthesized metal oxide nanowires. TUCF characteristics in both one-dimensional saturated and unsaturated regimes are identified and explained in terms of current theories. Furthermore, the TUCF's as a probe for the characteristic time scales of the mobile defects (two-level systems) are discussed.
Original language | English |
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Article number | 155432 |
Number of pages | 5 |
Journal | Physical Review B - Condensed Matter and Materials Physics |
Volume | 84 |
Issue number | 15 |
DOIs | |
State | Published - 17 Oct 2011 |