Temperature dependences of RF small-signal characteristics for the SOI dynamic threshold voltage MOSFET

Sheng Chun Wang; Pin Su; Kun Ming Chen; Sheng Yi Huang; Cheng Chou Hung; Guo Wei Huang

Temperature dependences of RF small-signal characteristics for the SOI dynamic threshold voltage MOSFET

Sheng Chun Wang^*, Pin Su, Kun Ming Chen, Sheng Yi Huang, Cheng Chou Hung, Guo Wei Huang

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

1 Scopus citations

Abstract

In this paper, the temperature dependences of RF small-signal characteristics for the SOI dynamic threshold voltage (DT) MOSFET (-25 to 125°C) are examined under different bias points. The temperature effects on the intrinsic small-signal parameters and body-related parasitics are also investigated. Moreover, along with our proposed expressions for the cut-off and maximum oscillation frequencies (f_t and f_max), the impact of these intrinsic parameters and parasitics on the temperature behaviors of the DT MOSFET's RF performance can be well captured and described.

Original language	English
Title of host publication	European Microwave Week 2009, EuMW 2009
Subtitle of host publication	Science, Progress and Quality at Radiofrequencies, Conference Proceedings - 4th European Microwave Integrated Circuits Conference, EuMIC 2009
Pages	69-72
Number of pages	4
State	Published - Oct 2009
Event	European Microwave Week 2009, EuMW 2009: Science, Progress and Quality at Radiofrequencies - 4th European Microwave Integrated Circuits Conference, EuMIC 2009 - Rome, Italy Duration: 28 Sep 2009 → 2 Oct 2009

Publication series

Name	European Microwave Week 2009, EuMW 2009: Science, Progress and Quality at Radiofrequencies, Conference Proceedings - 4th European Microwave Integrated Circuits Conference, EuMIC 2009

Conference

Conference	European Microwave Week 2009, EuMW 2009: Science, Progress and Quality at Radiofrequencies - 4th European Microwave Integrated Circuits Conference, EuMIC 2009
Country/Territory	Italy
City	Rome
Period	28/09/09 → 2/10/09

Cite this

Wang, S. C., Su, P., Chen, K. M., Huang, S. Y., Hung, C. C., & Huang, G. W. (2009). Temperature dependences of RF small-signal characteristics for the SOI dynamic threshold voltage MOSFET. In European Microwave Week 2009, EuMW 2009: Science, Progress and Quality at Radiofrequencies, Conference Proceedings - 4th European Microwave Integrated Circuits Conference, EuMIC 2009 (pp. 69-72). Article 5296462 (European Microwave Week 2009, EuMW 2009: Science, Progress and Quality at Radiofrequencies, Conference Proceedings - 4th European Microwave Integrated Circuits Conference, EuMIC 2009).

Wang, Sheng Chun ; Su, Pin ; Chen, Kun Ming et al. / Temperature dependences of RF small-signal characteristics for the SOI dynamic threshold voltage MOSFET. European Microwave Week 2009, EuMW 2009: Science, Progress and Quality at Radiofrequencies, Conference Proceedings - 4th European Microwave Integrated Circuits Conference, EuMIC 2009. 2009. pp. 69-72 (European Microwave Week 2009, EuMW 2009: Science, Progress and Quality at Radiofrequencies, Conference Proceedings - 4th European Microwave Integrated Circuits Conference, EuMIC 2009).

@inproceedings{c175de2cc4f64e708a5316d5195c210b,

title = "Temperature dependences of RF small-signal characteristics for the SOI dynamic threshold voltage MOSFET",

abstract = "In this paper, the temperature dependences of RF small-signal characteristics for the SOI dynamic threshold voltage (DT) MOSFET (-25 to 125°C) are examined under different bias points. The temperature effects on the intrinsic small-signal parameters and body-related parasitics are also investigated. Moreover, along with our proposed expressions for the cut-off and maximum oscillation frequencies (ft and fmax), the impact of these intrinsic parameters and parasitics on the temperature behaviors of the DT MOSFET's RF performance can be well captured and described.",

author = "Wang, {Sheng Chun} and Pin Su and Chen, {Kun Ming} and Huang, {Sheng Yi} and Hung, {Cheng Chou} and Huang, {Guo Wei}",

year = "2009",

month = oct,

language = "English",

isbn = "9782874870125",

series = "European Microwave Week 2009, EuMW 2009: Science, Progress and Quality at Radiofrequencies, Conference Proceedings - 4th European Microwave Integrated Circuits Conference, EuMIC 2009",

pages = "69--72",

booktitle = "European Microwave Week 2009, EuMW 2009",

note = "European Microwave Week 2009, EuMW 2009: Science, Progress and Quality at Radiofrequencies - 4th European Microwave Integrated Circuits Conference, EuMIC 2009 ; Conference date: 28-09-2009 Through 02-10-2009",

}

Wang, SC, Su, P, Chen, KM, Huang, SY, Hung, CC & Huang, GW 2009, Temperature dependences of RF small-signal characteristics for the SOI dynamic threshold voltage MOSFET. in European Microwave Week 2009, EuMW 2009: Science, Progress and Quality at Radiofrequencies, Conference Proceedings - 4th European Microwave Integrated Circuits Conference, EuMIC 2009., 5296462, European Microwave Week 2009, EuMW 2009: Science, Progress and Quality at Radiofrequencies, Conference Proceedings - 4th European Microwave Integrated Circuits Conference, EuMIC 2009, pp. 69-72, European Microwave Week 2009, EuMW 2009: Science, Progress and Quality at Radiofrequencies - 4th European Microwave Integrated Circuits Conference, EuMIC 2009, Rome, Italy, 28/09/09.

Temperature dependences of RF small-signal characteristics for the SOI dynamic threshold voltage MOSFET. / Wang, Sheng Chun; Su, Pin; Chen, Kun Ming et al.
European Microwave Week 2009, EuMW 2009: Science, Progress and Quality at Radiofrequencies, Conference Proceedings - 4th European Microwave Integrated Circuits Conference, EuMIC 2009. 2009. p. 69-72 5296462 (European Microwave Week 2009, EuMW 2009: Science, Progress and Quality at Radiofrequencies, Conference Proceedings - 4th European Microwave Integrated Circuits Conference, EuMIC 2009).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Temperature dependences of RF small-signal characteristics for the SOI dynamic threshold voltage MOSFET

AU - Wang, Sheng Chun

AU - Su, Pin

AU - Chen, Kun Ming

AU - Huang, Sheng Yi

AU - Hung, Cheng Chou

AU - Huang, Guo Wei

PY - 2009/10

Y1 - 2009/10

N2 - In this paper, the temperature dependences of RF small-signal characteristics for the SOI dynamic threshold voltage (DT) MOSFET (-25 to 125°C) are examined under different bias points. The temperature effects on the intrinsic small-signal parameters and body-related parasitics are also investigated. Moreover, along with our proposed expressions for the cut-off and maximum oscillation frequencies (ft and fmax), the impact of these intrinsic parameters and parasitics on the temperature behaviors of the DT MOSFET's RF performance can be well captured and described.

AB - In this paper, the temperature dependences of RF small-signal characteristics for the SOI dynamic threshold voltage (DT) MOSFET (-25 to 125°C) are examined under different bias points. The temperature effects on the intrinsic small-signal parameters and body-related parasitics are also investigated. Moreover, along with our proposed expressions for the cut-off and maximum oscillation frequencies (ft and fmax), the impact of these intrinsic parameters and parasitics on the temperature behaviors of the DT MOSFET's RF performance can be well captured and described.

UR - http://www.scopus.com/inward/record.url?scp=72449181397&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:72449181397

SN - 9782874870125

T3 - European Microwave Week 2009, EuMW 2009: Science, Progress and Quality at Radiofrequencies, Conference Proceedings - 4th European Microwave Integrated Circuits Conference, EuMIC 2009

SP - 69

EP - 72

BT - European Microwave Week 2009, EuMW 2009

T2 - European Microwave Week 2009, EuMW 2009: Science, Progress and Quality at Radiofrequencies - 4th European Microwave Integrated Circuits Conference, EuMIC 2009

Y2 - 28 September 2009 through 2 October 2009

ER -

Wang SC, Su P, Chen KM, Huang SY, Hung CC, Huang GW. Temperature dependences of RF small-signal characteristics for the SOI dynamic threshold voltage MOSFET. In European Microwave Week 2009, EuMW 2009: Science, Progress and Quality at Radiofrequencies, Conference Proceedings - 4th European Microwave Integrated Circuits Conference, EuMIC 2009. 2009. p. 69-72. 5296462. (European Microwave Week 2009, EuMW 2009: Science, Progress and Quality at Radiofrequencies, Conference Proceedings - 4th European Microwave Integrated Circuits Conference, EuMIC 2009).

Temperature dependences of RF small-signal characteristics for the SOI dynamic threshold voltage MOSFET

Abstract

Publication series

Conference

Other files and links

Fingerprint

Cite this