Temperature dependence of the penetration depth and effective dielectric constant measured by YBa2Cu3O7-δ microstrip ring resonators

H. K. Zeng*, Jenh-Yih Juang, Jiunn-Yuan Lin, Kaung-Hsiung Wu, T. M. Uen, Y. S. Gou

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Abstract

YBa2Cu3O7-δ(YBCO) superconducting ring resonators with a YBCO ground plane were successfully fabricated using double-side YBCO films deposited on LaAlO3 (LAO) substrates. The temperature dependent London penetration depth, Δλ = λ(T)-λ(5 K), was systematically studied by varying the oxygen content of the same resonator structure. For fully oxygenated case (δ = 0.05), the resonator exhibits a quality factor Q>104 at 16 K, and Δλ(T) displays a linear behavior over a wide range of temperatures. With increasing δ (e.g. δ = 0.2, 0.4), although Δλ is still linear in temperature, the slope changes with increasing oxygen deficiency. The results suggest that, in the underdoped regime, the inelastic scattering of charged carriers may become increasingly prominent. From the effective dielectric constant obtained from the ring resonator the dielectric constant of the LAO substrate was estimated to be εr≅25.5 at 5 K and a frequency of about 3.6 GHz.

Original languageAmerican English
Pages (from-to)97-102
Number of pages6
JournalUnknown Journal
Volume351
Issue number2
DOIs
StatePublished - 15 Mar 2001

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