System-level ESD protection design with on-chip transient detection circuit

Cheng Cheng Yen; Ming-Dou Ker; Pi Chia Shih

doi:10.1109/ICECS.2006.379864

System-level ESD protection design with on-chip transient detection circuit

Cheng Cheng Yen^*, Ming-Dou Ker, Pi Chia Shih

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

A new on-chip transient detection circuit for systemlevel electrostatic discharge (ESD) protection is proposed. By including this new proposed on-chip transient detection circuit, a hardware/firmware solution cooperated with power-on reset circuit has been analyzed to fix the system-level ESD issues. The circuit performance to detect different positive and negative fast electrical transients has been investigated by HSPICE simulator and verified in silicon chip. The experimental results in a 0.13μm CMOS process have confirmed that the proposed on-chip transient detection circuit can detect fast electrical transients during system-level ESD zapping.

Original language	English
Title of host publication	ICECS 2006 - 13th IEEE International Conference on Electronics, Circuits and Systems
Pages	616-619
Number of pages	4
DOIs	https://doi.org/10.1109/ICECS.2006.379864
State	Published - 2006
Event	ICECS 2006 - 13th IEEE International Conference on Electronics, Circuits and Systems - Nice, France Duration: 10 Dec 2006 → 13 Dec 2006

Publication series

Name	Proceedings of the IEEE International Conference on Electronics, Circuits, and Systems

Conference

Conference	ICECS 2006 - 13th IEEE International Conference on Electronics, Circuits and Systems
Country/Territory	France
City	Nice
Period	10/12/06 → 13/12/06

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10.1109/ICECS.2006.379864

Cite this

Yen, C. C., Ker, M.-D., & Shih, P. C. (2006). System-level ESD protection design with on-chip transient detection circuit. In ICECS 2006 - 13th IEEE International Conference on Electronics, Circuits and Systems (pp. 616-619). Article 4263442 (Proceedings of the IEEE International Conference on Electronics, Circuits, and Systems). https://doi.org/10.1109/ICECS.2006.379864

@inproceedings{ce2f9a59f164403aba6b4f682da9844e,

title = "System-level ESD protection design with on-chip transient detection circuit",

abstract = "A new on-chip transient detection circuit for systemlevel electrostatic discharge (ESD) protection is proposed. By including this new proposed on-chip transient detection circuit, a hardware/firmware solution cooperated with power-on reset circuit has been analyzed to fix the system-level ESD issues. The circuit performance to detect different positive and negative fast electrical transients has been investigated by HSPICE simulator and verified in silicon chip. The experimental results in a 0.13μm CMOS process have confirmed that the proposed on-chip transient detection circuit can detect fast electrical transients during system-level ESD zapping.",

author = "Yen, {Cheng Cheng} and Ming-Dou Ker and Shih, {Pi Chia}",

year = "2006",

doi = "10.1109/ICECS.2006.379864",

language = "English",

isbn = "1424403952",

series = "Proceedings of the IEEE International Conference on Electronics, Circuits, and Systems",

pages = "616--619",

booktitle = "ICECS 2006 - 13th IEEE International Conference on Electronics, Circuits and Systems",

note = "ICECS 2006 - 13th IEEE International Conference on Electronics, Circuits and Systems ; Conference date: 10-12-2006 Through 13-12-2006",

}

Yen, CC, Ker, M-D & Shih, PC 2006, System-level ESD protection design with on-chip transient detection circuit. in ICECS 2006 - 13th IEEE International Conference on Electronics, Circuits and Systems., 4263442, Proceedings of the IEEE International Conference on Electronics, Circuits, and Systems, pp. 616-619, ICECS 2006 - 13th IEEE International Conference on Electronics, Circuits and Systems, Nice, France, 10/12/06. https://doi.org/10.1109/ICECS.2006.379864

System-level ESD protection design with on-chip transient detection circuit. / Yen, Cheng Cheng; Ker, Ming-Dou; Shih, Pi Chia.
ICECS 2006 - 13th IEEE International Conference on Electronics, Circuits and Systems. 2006. p. 616-619 4263442 (Proceedings of the IEEE International Conference on Electronics, Circuits, and Systems).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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T1 - System-level ESD protection design with on-chip transient detection circuit

AU - Yen, Cheng Cheng

AU - Ker, Ming-Dou

AU - Shih, Pi Chia

PY - 2006

Y1 - 2006

N2 - A new on-chip transient detection circuit for systemlevel electrostatic discharge (ESD) protection is proposed. By including this new proposed on-chip transient detection circuit, a hardware/firmware solution cooperated with power-on reset circuit has been analyzed to fix the system-level ESD issues. The circuit performance to detect different positive and negative fast electrical transients has been investigated by HSPICE simulator and verified in silicon chip. The experimental results in a 0.13μm CMOS process have confirmed that the proposed on-chip transient detection circuit can detect fast electrical transients during system-level ESD zapping.

AB - A new on-chip transient detection circuit for systemlevel electrostatic discharge (ESD) protection is proposed. By including this new proposed on-chip transient detection circuit, a hardware/firmware solution cooperated with power-on reset circuit has been analyzed to fix the system-level ESD issues. The circuit performance to detect different positive and negative fast electrical transients has been investigated by HSPICE simulator and verified in silicon chip. The experimental results in a 0.13μm CMOS process have confirmed that the proposed on-chip transient detection circuit can detect fast electrical transients during system-level ESD zapping.

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U2 - 10.1109/ICECS.2006.379864

DO - 10.1109/ICECS.2006.379864

M3 - Conference contribution

AN - SCOPUS:47349085086

SN - 1424403952

SN - 9781424403950

T3 - Proceedings of the IEEE International Conference on Electronics, Circuits, and Systems

SP - 616

EP - 619

BT - ICECS 2006 - 13th IEEE International Conference on Electronics, Circuits and Systems

T2 - ICECS 2006 - 13th IEEE International Conference on Electronics, Circuits and Systems

Y2 - 10 December 2006 through 13 December 2006

ER -

System-level ESD protection design with on-chip transient detection circuit

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