TY - JOUR
T1 - Syndrome simulation and syndrome test for unscanned interconnects
AU - Su, Chau-Chin
AU - Hwang, Shyh Shen
AU - Jou, Shyh-Jye
AU - Ting, Yuan Tzu
PY - 1996/12/1
Y1 - 1996/12/1
N2 - In this paper, we present a syndrome test methodology for the testing of unscanned interconnects in a boundary scan environment. Mathematical equations are derived for the relationship of test length, faulty-free and faulty syndromes, and tolerable error rate. To calculate fault-free and faulty syndromes, we propose an event driven syndrome simulation algorithm. To shorten testing time and reduce test cost, we transform and solved the problem as a set covering problem.
AB - In this paper, we present a syndrome test methodology for the testing of unscanned interconnects in a boundary scan environment. Mathematical equations are derived for the relationship of test length, faulty-free and faulty syndromes, and tolerable error rate. To calculate fault-free and faulty syndromes, we propose an event driven syndrome simulation algorithm. To shorten testing time and reduce test cost, we transform and solved the problem as a set covering problem.
UR - http://www.scopus.com/inward/record.url?scp=0030394680&partnerID=8YFLogxK
U2 - 10.1109/ATS.1996.555138
DO - 10.1109/ATS.1996.555138
M3 - Conference article
AN - SCOPUS:0030394680
SN - 1081-7735
SP - 62
EP - 67
JO - Proceedings of the Asian Test Symposium
JF - Proceedings of the Asian Test Symposium
M1 - 5565433
T2 - Proceedings of the 1996 5th Asian Test Symposium, ATS'96
Y2 - 20 November 1996 through 22 November 1996
ER -