Syndrome simulation and syndrome test for unscanned interconnects

Chau-Chin Su; Shyh Shen Hwang; Shyh-Jye Jou; Yuan Tzu Ting

doi:10.1109/ATS.1996.555138

Syndrome simulation and syndrome test for unscanned interconnects

Chau-Chin Su^*, Shyh Shen Hwang, Shyh-Jye Jou, Yuan Tzu Ting

^*Corresponding author for this work

Research output: Contribution to journal › Conference article › peer-review

3 Scopus citations

Abstract

In this paper, we present a syndrome test methodology for the testing of unscanned interconnects in a boundary scan environment. Mathematical equations are derived for the relationship of test length, faulty-free and faulty syndromes, and tolerable error rate. To calculate fault-free and faulty syndromes, we propose an event driven syndrome simulation algorithm. To shorten testing time and reduce test cost, we transform and solved the problem as a set covering problem.

Original language	English
Article number	5565433
Pages (from-to)	62-67
Number of pages	6
Journal	Proceedings of the Asian Test Symposium
DOIs	https://doi.org/10.1109/ATS.1996.555138
State	Published - 1 Dec 1996
Event	Proceedings of the 1996 5th Asian Test Symposium, ATS'96 - Hsinchu, Taiwan Duration: 20 Nov 1996 → 22 Nov 1996

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10.1109/ATS.1996.555138

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title = "Syndrome simulation and syndrome test for unscanned interconnects",

abstract = "In this paper, we present a syndrome test methodology for the testing of unscanned interconnects in a boundary scan environment. Mathematical equations are derived for the relationship of test length, faulty-free and faulty syndromes, and tolerable error rate. To calculate fault-free and faulty syndromes, we propose an event driven syndrome simulation algorithm. To shorten testing time and reduce test cost, we transform and solved the problem as a set covering problem.",

author = "Chau-Chin Su and Hwang, {Shyh Shen} and Shyh-Jye Jou and Ting, {Yuan Tzu}",

year = "1996",

month = dec,

day = "1",

doi = "10.1109/ATS.1996.555138",

language = "English",

pages = "62--67",

journal = "Proceedings of the Asian Test Symposium",

issn = "1081-7735",

publisher = "IEEE Computer Society",

note = "null ; Conference date: 20-11-1996 Through 22-11-1996",

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TY - JOUR

T1 - Syndrome simulation and syndrome test for unscanned interconnects

AU - Su, Chau-Chin

AU - Hwang, Shyh Shen

AU - Jou, Shyh-Jye

AU - Ting, Yuan Tzu

PY - 1996/12/1

Y1 - 1996/12/1

N2 - In this paper, we present a syndrome test methodology for the testing of unscanned interconnects in a boundary scan environment. Mathematical equations are derived for the relationship of test length, faulty-free and faulty syndromes, and tolerable error rate. To calculate fault-free and faulty syndromes, we propose an event driven syndrome simulation algorithm. To shorten testing time and reduce test cost, we transform and solved the problem as a set covering problem.

AB - In this paper, we present a syndrome test methodology for the testing of unscanned interconnects in a boundary scan environment. Mathematical equations are derived for the relationship of test length, faulty-free and faulty syndromes, and tolerable error rate. To calculate fault-free and faulty syndromes, we propose an event driven syndrome simulation algorithm. To shorten testing time and reduce test cost, we transform and solved the problem as a set covering problem.

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U2 - 10.1109/ATS.1996.555138

DO - 10.1109/ATS.1996.555138

M3 - Conference article

AN - SCOPUS:0030394680

SP - 62

EP - 67

JO - Proceedings of the Asian Test Symposium

JF - Proceedings of the Asian Test Symposium

SN - 1081-7735

M1 - 5565433

Y2 - 20 November 1996 through 22 November 1996

ER -

Syndrome simulation and syndrome test for unscanned interconnects

Abstract

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