Syndrome simulation and syndrome test for unscanned interconnects

Chau-Chin Su*, Shyh Shen Hwang, Shyh-Jye Jou, Yuan Tzu Ting

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

3 Scopus citations


In this paper, we present a syndrome test methodology for the testing of unscanned interconnects in a boundary scan environment. Mathematical equations are derived for the relationship of test length, faulty-free and faulty syndromes, and tolerable error rate. To calculate fault-free and faulty syndromes, we propose an event driven syndrome simulation algorithm. To shorten testing time and reduce test cost, we transform and solved the problem as a set covering problem.

Original languageEnglish
Article number5565433
Pages (from-to)62-67
Number of pages6
JournalProceedings of the Asian Test Symposium
StatePublished - 1 Dec 1996
EventProceedings of the 1996 5th Asian Test Symposium, ATS'96 - Hsinchu, Taiwan
Duration: 20 Nov 199622 Nov 1996


Dive into the research topics of 'Syndrome simulation and syndrome test for unscanned interconnects'. Together they form a unique fingerprint.

Cite this