Synchronized Subharmonic Modulation in Stimulated Emission Microscopy

Subir Das, Fu Jen Kao*

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

In this paper, high modulation technique with frequency 38 MHz is demonstrated for stimulated emission (SE) microscopy. In this way, fast imaging speed and shot noise limited sensitivity can be achieved in SE signal detection.

Original languageEnglish
Title of host publication25th Opto-Electronics and Communications Conference, OECC 2020
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781728154459
DOIs
StatePublished - 4 Oct 2020
Event25th Opto-Electronics and Communications Conference, OECC 2020 - Taipei, Taiwan
Duration: 4 Oct 20208 Oct 2020

Publication series

Name25th Opto-Electronics and Communications Conference, OECC 2020

Conference

Conference25th Opto-Electronics and Communications Conference, OECC 2020
Country/TerritoryTaiwan
CityTaipei
Period4/10/208/10/20

Keywords

  • High frequency
  • Stimulated emission microscopy
  • Subharmonic modulation

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