Abstract
A new substrate for surface-enhanced Raman spectroscopy has been developed in the form of silicon nanotips, by electron cyclotron resonance plasma chemical vapor deposition, with apex diameters of ∼2 nm, lengths of 1000 nm, and densities of 1011/cm2. The surface areas of the nanotips are ∼150 m2cm-3, comparable with the best-quality porous silicon. Ion-beam-sputtered silver self-assembles on these substrates as nanoparticles of 4-10 nm diameter and these metallic nanoparticles act as surface enhancement centers for Raman spectroscopy. Standard molecules such as Rhodamine 6G and trans-1,2-bis(4-pyridyl)ethylene (BPE) of concentrations in the range of 10-6 to 10-10 M have been studied on these substrates and enhancements in the range of 106 to 108 were observed. These dry etched substrates, unlike those conventionally prepared by wet chemistry, are compatible with silicon device technology and are remarkably stable and reproducible.
Original language | English |
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Pages (from-to) | 553-559 |
Number of pages | 7 |
Journal | Chemistry of Materials |
Volume | 17 |
Issue number | 3 |
DOIs | |
State | Published - 8 Feb 2005 |