Suppression of Schottky leakage current in island-in amorphous silicon thin film transistors with the CuCuMg as source/drain metal
- M. C. Wang
- , T. C. Chang*
- , Po-Tsun Liu
- , R. W. Xiao
- , L. F. Lin
- , Y. Y. Li
- , F. S. Huang
- , J. R. Chen
*Corresponding author for this work
Research output: Contribution to journal › Article › peer-review
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