Suppression of photo-bias induced instability for amorphous indium tungsten oxide thin film transistors with bi-layer structure

  • Po-Tsun Liu*
  • , Chih Hsiang Chang
  • , Chih Jui Chang
  • *Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

34 Scopus citations

Fingerprint

Dive into the research topics of 'Suppression of photo-bias induced instability for amorphous indium tungsten oxide thin film transistors with bi-layer structure'. Together they form a unique fingerprint.

Keyphrases

Engineering

Physics