Subgap State Engineering Using Nitrogen Incorporation to Improve Reliability of Amorphous InGaZnO Thin-Film Transistors in Various Stressing Conditions

GongTan Li, Runze Zhan, Bo-Ru Yang*, Chuan Liu, Chengyuan Dong, Chia-Yu Lee, Yuan-Chun Wu, Po-Yen Lu, Shaozhi Deng, Han-Ping Shieh, Ningsheng Xu

*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

21 Scopus citations

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Engineering

Physics

Earth and Planetary Sciences

Material Science

Chemical Engineering