Study on oxygen-dependent instability of amorphous In-Ga-Zn-O TFT and completely stable device under both positive and negative bias stresses

Wei Tsung Chen*, Hsiao-Wen Zan, Shih Yi Lo, Shih Chin Kao, Chuang Chuang Tsai, Jian Hong Lin, Chun Hsiang Fang, Chung Chun Lee

*Corresponding author for this work

Research output: Contribution to conferencePaperpeer-review

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Engineering & Materials Science