Study of hole concentration of 1,4-bis[N-(1-naphthyl)-N′-phenylamino] -4,4′ diamine doped with tungsten oxide by admittance spectroscopy

Ming Ta Hsieh*, Chan Ching Chang, Jenn-Fang Chen, Chin H. Chen

*Corresponding author for this work

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Abstract

The effect of tungsten oxide (WO3) incorporation into 1,4-bis[N-(1-naphthyl)-N′-phenylamino]-4,4′ diamine (NPB) layer is investigated in NPB-tris(8-hydroxyquinoline)aluminium heterojunction organic light-emitting diodes. The admittance spectroscopy studies show that increasing the WO3 volume percentage from 0% to 16% can increase the hole concentration of the NBP layer from 1.97 × 1014 to 1.90 × 1017 cm-3 and decrease the activation energy of the resistance of the NPB layer from 0.354 to 0.176 eV. Thus, this incorporation reduces the Ohmic loss and increases the band bending in the NBP layer near the interface, resulting in an improved hole injection via tunneling through a narrow depletion region.

Original languageEnglish
Article number103510
JournalApplied Physics Letters
Volume89
Issue number10
DOIs
StatePublished - 18 Sep 2006

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