Structure study of GaN:Mg films by X-ray absorption near-edge structure spectroscopy

Y. C. Pan*, S. F. Wang, W. H. Lee, W. C. Lin, C. I. Chiang, H. Chang, H. H. Hsieh, J. M. Chen, D. S. Lin, M. C. Lee, Wei-Kuo Chen, W. H. Chen

*Corresponding author for this work

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