Structural and electrical properties of high-k HoTiO₃ gate dielectrics

Tung Ming Pan^*, Li Chen Yen, Chia Wei Hu, Tien-Sheng Chao

^*Corresponding author for this work

Department of Electrophysics

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

4 Scopus citations

Engineering & Materials Science