Spectral analysis of noise sources in InGaN light emitting diodes

Gray Lin*, Kuan Lin Su, Shih Tsun Yang, Tzung Te Chen, Chiu Ling Chen

*Corresponding author for this work

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    Abstract

    Noise characterization of InGaN light emitting diodes shows that the exponent in current dependence of low-frequency flicker noise amplitude and the corner frequency in highfrequency generation-recombination noise spectra are two possible indicators for device reliability.

    Original languageEnglish
    Title of host publicationCLEO
    Subtitle of host publication2011 - Laser Science to Photonic Applications
    PublisherIEEE
    ISBN (Electronic)9781557529114
    ISBN (Print)9781457712234
    DOIs
    StatePublished - 1 May 2011
    Event2011 Conference on Lasers and Electro-Optics, CLEO 2011 - Baltimore, MD, United States
    Duration: 1 May 20116 May 2011

    Publication series

    Name2011 Conference on Lasers and Electro-Optics: Laser Science to Photonic Applications, CLEO 2011

    Conference

    Conference2011 Conference on Lasers and Electro-Optics, CLEO 2011
    Country/TerritoryUnited States
    CityBaltimore, MD
    Period1/05/116/05/11

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