Space- and time-resolved mapping of ionic dynamic and electroresistive phenomena in lateral devices

Evgheni Strelcov*, Stephen Jesse, Yen Lin Huang, Yung Chun Teng, Ivan I. Kravchenko, Ying-hao Chu, Sergei V. Kalinin

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

32 Scopus citations

Abstract

A scanning probe microscopy-based technique for probing local ionic and electronic transport and their dynamic behavior on the 10 ms to 10 s scale is presented. The time-resolved Kelvin probe force microscopy (tr-KPFM) allows mapping of surface potential in both space and time domains, visualizing electronic and ionic charge dynamics and separating underlying processes based on their time responses. Here, tr-KPFM is employed to explore the interplay of the adsorbed surface ions and bulk oxygen vacancies and their role in the resistive switching in a Ca-substituted bismuth ferrite thin film.

Original languageEnglish
Pages (from-to)6806-6815
Number of pages10
JournalACS Nano
Volume7
Issue number8
DOIs
StatePublished - 9 Jul 2013

Keywords

  • Ca-BFO
  • ionic dynamics
  • KPFM
  • oxygen vacancy
  • surface potential distribution

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