Small-pixel TFT flaw detection and measurement using voltage imaging technique

Yao Chin Wang*, Bor-Shyh Lin

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

9 Scopus citations


The paper proposed the characteristics of flaw measurement in small-pixel design mobile displays based on TFT array panel with respect to electrical-optic characterization. For advanced small-pixel and high-resolution mobile display applications, the display pixels on array process are smaller, detecting small-pixel defect played an important role than previously seen in non-small-pixel TFT array panels for managing process yield. The study resulted in small-pixel size TFT array show the flaw detection performance and preference approaches using the voltage imaging technique. It provides an initial insight into the high-resolution of small-pixel size designs for advanced mobile displays application.

Original languageEnglish
Pages (from-to)121-125
Number of pages5
JournalMeasurement: Journal of the International Measurement Confederation
Issue number1
StatePublished - 18 Dec 2013


  • Flaw detection
  • Measurement
  • Small-pixel
  • TFT array
  • Voltage imaging


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