Single-ended subthreshold SRAM with asymmetrical write/read-assist

Ming Hsien Tu*, Jihi Yu Lin, Ming Chien Tsai, Shyh-Jye Jou, Ching Te Chuang

*Corresponding author for this work

    Research output: Contribution to journalArticlepeer-review

    104 Scopus citations

    Abstract

    In this paper, asymmetrical Write-assist cell virtual ground biasing scheme and positive feedback sensing keeper schemes are proposed to improve the read static noise margin (RSNM), write margin (WM), and operation speed of a single-ended read/write 8 T SRAM cell. A 4 Kbit SRAM test chip is implemented in 90 nm CMOS technology. The test chip measurement results show that at 0.2 V V DD , an operation frequency of 6.0 MHz can be achieved with power consumption of 10.4 μW.

    Original languageEnglish
    Article number5634142
    Pages (from-to)3039-3047
    Number of pages9
    JournalIEEE Transactions on Circuits and Systems I: Regular Papers
    Volume57
    Issue number12
    DOIs
    StatePublished - 15 Nov 2010

    Keywords

    • Low power
    • low voltage
    • single-ended SRAM

    Fingerprint

    Dive into the research topics of 'Single-ended subthreshold SRAM with asymmetrical write/read-assist'. Together they form a unique fingerprint.

    Cite this