Simultaneous measurement of phase retardation and fast-axis angle of phase retardation plate

Wen Chuan Kuo*, Kuo Yu Liao, Gwo Jen Jan, Hui Kang Teng, Chien Chou

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

15 Scopus citations

Abstract

A phase retardation plate, such as a quarter-wave plate, is able to control the state of polarization. Thus, a precise simultaneous determination of phase delay between two eigen-polarization states and its fast-axis angle is essential to the performance of the phase retardation plate to control the state of polarization. Consequently, the measurement of the two-dimensional spatiotemporal distribution of phase retardation and the fast-axis angle become crucial when a large-area of phase retardation plate, such as that for a liquid crystal display, is characterized, due to the inhomogeneity of the retardation plate. In order to measure the linear birefringence parameters, phase retardation and fast-axis angle at the same time, a novel polarized optical heterodyne interferometer is developed, with which the parameters of a quarter-wave plate are successfully measured and verified. The features of this device are (1) a common-path configuration, (2) measurement independent of laser intensity, and (3) the capability of simultaneously determining the spatiotemporal distributions of phase retardation and fast-axis angle of a retardation plate. 10.1143/JJAP.44.1095

Original languageEnglish
Pages (from-to)1095-1100
Number of pages6
JournalJapanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
Volume44
Issue number2
DOIs
StatePublished - Feb 2005

Keywords

  • Common-path
  • Fast-axis angle
  • Interferometer
  • Optical heterodyne
  • Phase retardation

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