Simulation and investigation of random grain-boundary-induced variabilities for stackable NAND flash using 3-D voronoi grain patterns

Ching Wei Yang, Pin Su

    Research output: Contribution to journal › Article › peer-review

    30 Scopus citations

    Fingerprint

    Dive into the research topics of 'Simulation and investigation of random grain-boundary-induced variabilities for stackable NAND flash using 3-D voronoi grain patterns'. Together they form a unique fingerprint.

    Keyphrases

    Earth and Planetary Sciences

    Engineering