Self-Restoring and Low-Jitter Circuits for High Timing-Resolution SPAD Sensing Applications

Hsi Hao Huang, Chun Hsien Liu, Tzu Yun Huang, Sheng Di Lin, Chen Yi Lee

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

3 Scopus citations

Abstract

Single-photon avalanche diode (SPAD) imagers have recently emerged in the fields of high-resolution imaging, such as fluorescence lifetime imaging microscopy. This paper presents a new design of passive quenching active reset (PQAR) circuit for high timing-resolution SPAD imagers. The PQAR circuit contains a logic control circuit for self-restoring and dead time reduction in the event of two adjacent incoming photons. Post-layout simulation result shows that the dead time of the sensor has been reduced to 5.46 ns for two adjacent incoming photons, and measurement result shows that the jitter of the photon-induced signal width has been reduced to 63ps. We also present the properties and measurement results of the passive quenching passive reset circuit and the passive quenching active clock-driven reset circuit. Comparison shows that of the three circuits we demonstrate, the PQAR circuit is better suited for the high timing-resolution SPAD imagers.

Original languageEnglish
Title of host publicationISCAS 2023 - 56th IEEE International Symposium on Circuits and Systems, Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781665451093
DOIs
StatePublished - 2023
Event56th IEEE International Symposium on Circuits and Systems, ISCAS 2023 - Monterey, United States
Duration: 21 May 202325 May 2023

Publication series

NameProceedings - IEEE International Symposium on Circuits and Systems
Volume2023-May
ISSN (Print)0271-4310

Conference

Conference56th IEEE International Symposium on Circuits and Systems, ISCAS 2023
Country/TerritoryUnited States
CityMonterey
Period21/05/2325/05/23

Keywords

  • PQAR circuit
  • SPAD
  • fluorescence lifetime imaging microscopy (FLIM)

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