Self-matched ESD cell in CMOS technology for 60-GHz broadband RF applications

Chun Yu Lin; Li Wei Chu; Ming-Dou Ker; Tse Hua Lu; Ping Fang Hung; Hsiao Chun Li

doi:10.1109/RFIC.2010.5477291

Self-matched ESD cell in CMOS technology for 60-GHz broadband RF applications

Chun Yu Lin^*, Li Wei Chu, Ming-Dou Ker, Tse Hua Lu, Ping Fang Hung, Hsiao Chun Li

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

15 Scopus citations

Abstract

A self-matched ESD cell library has been implemented in a commercial sub-100nm CMOS process for 60-GHz broadband RF applications. This ESD cell library has reached the 50-Ω input/output matching to reduce the design complexity for RF circuit designer and to provide suitable electrostatic discharge (ESD) protection. Experimental results of this ESD cell library have successfully verified the ESD robustness and the RF characteristics in the 60-GHz frequency band. This self-matched ESD cell library is easily to be used for ESD protection design in the 60-GHz broadband RF applications.

Original language	English
Title of host publication	Proceedings of the 2010 IEEE Radio Frequency Integrated Circuits Symposium, RFIC 2010
Pages	573-576
Number of pages	4
DOIs	https://doi.org/10.1109/RFIC.2010.5477291
State	Published - 16 Jul 2010
Event	2010 IEEE Radio Frequency Integrated Circuits Symposium, RFIC 2010 - Anaheim, CA, United States Duration: 23 May 2010 → 25 May 2010

Publication series

Name	Digest of Papers - IEEE Radio Frequency Integrated Circuits Symposium
ISSN (Print)	1529-2517

Conference

Conference	2010 IEEE Radio Frequency Integrated Circuits Symposium, RFIC 2010
Country/Territory	United States
City	Anaheim, CA
Period	23/05/10 → 25/05/10

Keywords

60 GHz
Broadband
Electrostatic discharge (ESD)
ESD cell
V-band

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10.1109/RFIC.2010.5477291

Cite this

Lin, C. Y., Chu, L. W., Ker, M.-D., Lu, T. H., Hung, P. F., & Li, H. C. (2010). Self-matched ESD cell in CMOS technology for 60-GHz broadband RF applications. In Proceedings of the 2010 IEEE Radio Frequency Integrated Circuits Symposium, RFIC 2010 (pp. 573-576). Article 10.1109/RFIC.2010.5477291 (Digest of Papers - IEEE Radio Frequency Integrated Circuits Symposium). https://doi.org/10.1109/RFIC.2010.5477291

@inproceedings{fb2e3c6b1b744169a64433d0b8649f6f,

title = "Self-matched ESD cell in CMOS technology for 60-GHz broadband RF applications",

abstract = "A self-matched ESD cell library has been implemented in a commercial sub-100nm CMOS process for 60-GHz broadband RF applications. This ESD cell library has reached the 50-Ω input/output matching to reduce the design complexity for RF circuit designer and to provide suitable electrostatic discharge (ESD) protection. Experimental results of this ESD cell library have successfully verified the ESD robustness and the RF characteristics in the 60-GHz frequency band. This self-matched ESD cell library is easily to be used for ESD protection design in the 60-GHz broadband RF applications.",

keywords = "60 GHz, Broadband, Electrostatic discharge (ESD), ESD cell, V-band",

author = "Lin, {Chun Yu} and Chu, {Li Wei} and Ming-Dou Ker and Lu, {Tse Hua} and Hung, {Ping Fang} and Li, {Hsiao Chun}",

year = "2010",

month = jul,

day = "16",

doi = "10.1109/RFIC.2010.5477291",

language = "English",

isbn = "9781424462421",

series = "Digest of Papers - IEEE Radio Frequency Integrated Circuits Symposium",

pages = "573--576",

booktitle = "Proceedings of the 2010 IEEE Radio Frequency Integrated Circuits Symposium, RFIC 2010",

note = "2010 IEEE Radio Frequency Integrated Circuits Symposium, RFIC 2010 ; Conference date: 23-05-2010 Through 25-05-2010",

}

Lin, CY, Chu, LW, Ker, M-D, Lu, TH, Hung, PF & Li, HC 2010, Self-matched ESD cell in CMOS technology for 60-GHz broadband RF applications. in Proceedings of the 2010 IEEE Radio Frequency Integrated Circuits Symposium, RFIC 2010., 10.1109/RFIC.2010.5477291, Digest of Papers - IEEE Radio Frequency Integrated Circuits Symposium, pp. 573-576, 2010 IEEE Radio Frequency Integrated Circuits Symposium, RFIC 2010, Anaheim, CA, United States, 23/05/10. https://doi.org/10.1109/RFIC.2010.5477291

Self-matched ESD cell in CMOS technology for 60-GHz broadband RF applications. / Lin, Chun Yu; Chu, Li Wei; Ker, Ming-Dou et al.
Proceedings of the 2010 IEEE Radio Frequency Integrated Circuits Symposium, RFIC 2010. 2010. p. 573-576 10.1109/RFIC.2010.5477291 (Digest of Papers - IEEE Radio Frequency Integrated Circuits Symposium).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Self-matched ESD cell in CMOS technology for 60-GHz broadband RF applications

AU - Lin, Chun Yu

AU - Chu, Li Wei

AU - Ker, Ming-Dou

AU - Lu, Tse Hua

AU - Hung, Ping Fang

AU - Li, Hsiao Chun

PY - 2010/7/16

Y1 - 2010/7/16

N2 - A self-matched ESD cell library has been implemented in a commercial sub-100nm CMOS process for 60-GHz broadband RF applications. This ESD cell library has reached the 50-Ω input/output matching to reduce the design complexity for RF circuit designer and to provide suitable electrostatic discharge (ESD) protection. Experimental results of this ESD cell library have successfully verified the ESD robustness and the RF characteristics in the 60-GHz frequency band. This self-matched ESD cell library is easily to be used for ESD protection design in the 60-GHz broadband RF applications.

AB - A self-matched ESD cell library has been implemented in a commercial sub-100nm CMOS process for 60-GHz broadband RF applications. This ESD cell library has reached the 50-Ω input/output matching to reduce the design complexity for RF circuit designer and to provide suitable electrostatic discharge (ESD) protection. Experimental results of this ESD cell library have successfully verified the ESD robustness and the RF characteristics in the 60-GHz frequency band. This self-matched ESD cell library is easily to be used for ESD protection design in the 60-GHz broadband RF applications.

KW - 60 GHz

KW - Broadband

KW - Electrostatic discharge (ESD)

KW - ESD cell

KW - V-band

UR - http://www.scopus.com/inward/record.url?scp=77954484538&partnerID=8YFLogxK

U2 - 10.1109/RFIC.2010.5477291

DO - 10.1109/RFIC.2010.5477291

M3 - Conference contribution

AN - SCOPUS:77954484538

SN - 9781424462421

T3 - Digest of Papers - IEEE Radio Frequency Integrated Circuits Symposium

SP - 573

EP - 576

BT - Proceedings of the 2010 IEEE Radio Frequency Integrated Circuits Symposium, RFIC 2010

T2 - 2010 IEEE Radio Frequency Integrated Circuits Symposium, RFIC 2010

Y2 - 23 May 2010 through 25 May 2010

ER -

Self-matched ESD cell in CMOS technology for 60-GHz broadband RF applications

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