Scaled contact length with low contact resistance in monolayer 2D channel transistors

Wen Chia Wu, Terry Y.T. Hung, D. Mahaveer Sathaiya, Dongxu Fan, Goutham Arutchelvan, Chen Feng Hsu, Sheng Kai Su, Ang Sheng Chou, Edward Chen, Weisheng Li, Zhihao Yu, Hao Qiu, Ying Mei Yang, Kuang I. Lin, Yun Yang Shen, Wen Hao Chang, San Lin Liew, Vincent Hou, Jin Cai, Chung Cheng WuJeff Wu, H. S. Philip Wong, Xinran Wang*, Chao Hsin Chien*, Chao Ching Cheng, Iuliana P. Radu*

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

4 Scopus citations

Fingerprint

Dive into the research topics of 'Scaled contact length with low contact resistance in monolayer 2D channel transistors'. Together they form a unique fingerprint.

Keyphrases

Engineering

Material Science