Residual Knowledge Retention for Edge Devices

Cheng Fu Liou, Paul Kuo, Jiun In Guo

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

Abstract

This paper proposes an approach for continual learning, Knowledge Retention (KR), that learns new information without accessing data from previous tasks. A KR unit is based on the embedding layer that identifies the important kernel in the convolution layer, which preserves key parameters and allows the weights to be reused across tasks. To construct higher-order generalization, we design a Residual Knowledge Retention (RKR) architecture that facilitates the network to stack deeper layers. Additionally, we rethink the benefits of different residual blocks respectively after employing depthwise convolutions. A surprising observation is that the basic block taking advantage of depthwise convolutions achieves higher representational power and builds a more lightweight model than the bottleneck block counterpart. On the Alternating CIFAR10/100 benchmark, we empirically show that the KR unit can be integrated into diverse networks and effectively prevents catastrophic forgetting. Finally, we demonstrate that RKR significantly outperforms the existing state-of-the-art continual learning methods with at least 6 times lower model complexity in two different scenarios for continual learning, which supports that the proposed approach is more competitive for resource-limited edge devices.

Original languageEnglish
Title of host publicationProceedings of 2021 IEEE 30th International Symposium on Industrial Electronics, ISIE 2021
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781728190235
DOIs
StatePublished - 20 Jun 2021
Event30th IEEE International Symposium on Industrial Electronics, ISIE 2021 - Kyoto, Japan
Duration: 20 Jun 202123 Jun 2021

Publication series

NameIEEE International Symposium on Industrial Electronics
Volume2021-June

Conference

Conference30th IEEE International Symposium on Industrial Electronics, ISIE 2021
Country/TerritoryJapan
CityKyoto
Period20/06/2123/06/21

Keywords

  • Continual learning
  • Embedding layer
  • catastrophic forgetting
  • depthwise convolution
  • edge device
  • residual block

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