@inproceedings{cac6f941d52544b890026fa963f8f6ca,
title = "Residual Knowledge Retention for Edge Devices",
abstract = "This paper proposes an approach for continual learning, Knowledge Retention (KR), that learns new information without accessing data from previous tasks. A KR unit is based on the embedding layer that identifies the important kernel in the convolution layer, which preserves key parameters and allows the weights to be reused across tasks. To construct higher-order generalization, we design a Residual Knowledge Retention (RKR) architecture that facilitates the network to stack deeper layers. Additionally, we rethink the benefits of different residual blocks respectively after employing depthwise convolutions. A surprising observation is that the basic block taking advantage of depthwise convolutions achieves higher representational power and builds a more lightweight model than the bottleneck block counterpart. On the Alternating CIFAR10/100 benchmark, we empirically show that the KR unit can be integrated into diverse networks and effectively prevents catastrophic forgetting. Finally, we demonstrate that RKR significantly outperforms the existing state-of-the-art continual learning methods with at least 6 times lower model complexity in two different scenarios for continual learning, which supports that the proposed approach is more competitive for resource-limited edge devices.",
keywords = "Continual learning, Embedding layer, catastrophic forgetting, depthwise convolution, edge device, residual block",
author = "Liou, {Cheng Fu} and Paul Kuo and Guo, {Jiun In}",
note = "Publisher Copyright: {\textcopyright} 2021 IEEE.; 30th IEEE International Symposium on Industrial Electronics, ISIE 2021 ; Conference date: 20-06-2021 Through 23-06-2021",
year = "2021",
month = jun,
day = "20",
doi = "10.1109/ISIE45552.2021.9576374",
language = "English",
series = "IEEE International Symposium on Industrial Electronics",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
booktitle = "Proceedings of 2021 IEEE 30th International Symposium on Industrial Electronics, ISIE 2021",
address = "United States",
}